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001     28621
005     20180210144032.0
024 7 _ |a 0734-211X
|2 ISSN
037 _ _ |a PreJuSER-28621
082 _ _ |a 530
100 1 _ |a Pavlovska, A.
|b 0
|u FZJ
|0 P:(DE-Juel1)VDB18785
245 _ _ |a A low energy electron microscopy study of In on Si(111)
260 _ _ |a New York, NY
|b Inst.
|c 2002
300 _ _ |a 2478 - 2491
336 7 _ |a Journal Article
|0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|0 0
|2 EndNote
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a article
|2 DRIVER
440 _ 0 |a Journal of Vacuum Science and Technology B
|x 0734-211X
|0 3988
|v 20
500 _ _ |a Record converted from VDB: 12.11.2012
536 _ _ |a Kondensierte Materie
|c M02
|2 G:(DE-HGF)
|0 G:(DE-Juel1)FUEK242
|x 0
700 1 _ |a Bauer, E.
|b 1
|u FZJ
|0 P:(DE-Juel1)VDB18786
700 1 _ |a Giesen, M.
|b 2
|u FZJ
|0 P:(DE-Juel1)4744
773 _ _ |g Vol. 20, p. 2478 - 2491
|p 2478 - 2491
|q 20<2478 - 2491
|0 PERI:(DE-600)1475429-0
|t Journal of vacuum science & technology / B
|v 20
|y 2002
|x 0734-211X
909 C O |o oai:juser.fz-juelich.de:28621
|p VDB
913 1 _ |k M02
|v Kondensierte Materie
|l Kondensierte Materie
|b Materie
|0 G:(DE-Juel1)FUEK242
|x 0
914 1 _ |a Nachtrag
|y 2002
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
920 1 _ |k ISG-3
|l Institut für Grenzflächen und Vakuumtechnologien
|d 31.12.2006
|g ISG
|0 I:(DE-Juel1)VDB43
|x 0
970 _ _ |a VDB:(DE-Juel1)22919
980 _ _ |a VDB
980 _ _ |a ConvertedRecord
980 _ _ |a journal
980 _ _ |a I:(DE-Juel1)PGI-3-20110106
980 _ _ |a UNRESTRICTED
981 _ _ |a I:(DE-Juel1)PGI-3-20110106

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