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@ARTICLE{Bittkau:2874,
      author       = {Bittkau, K. and Carius, R. and Bielawny, A. and Wehrspohn,
                      R. B.},
      title        = {{I}nfluence of defects in opal photonic crystals on the
                      optical transmission imaged by near-field scanning optical
                      microscopy},
      journal      = {Journal of materials science / Materials in electronics},
      volume       = {19},
      issn         = {0957-4522},
      address      = {Dordrecht [u.a.]},
      publisher    = {Springer Science + Business Media B.V},
      reportid     = {PreJuSER-2874},
      pages        = {203 - 207},
      year         = {2008},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {The electric field intensity above the surface of opal
                      photonic crystals (PCs) and its alteration due to
                      'crystallographic' defects is investigated by using
                      nearfield scanning optical microscopy (NSOM). The photonic
                      crystals are developed by dip coating in a liquid solution
                      with PMMA opals. Highly regular hexagonal planes with
                      lattice constants of about 260 nm grow on the glass
                      substrate. During the drying process several crack lines are
                      formed that correspond to defects in the crystal structure.
                      The transmitted light intensity at wavelengths inside and
                      outside of the stop band of the PC is studied with NSOM
                      using a tapered fiber tip scanning in all three dimensions.
                      By this technique, a 3D image of the electric field
                      intensity can be measured with a resolution better than 100
                      nm. The results show that the local optical field
                      distribution is strongly dominated by the defect states in
                      all directions in space over a length scale of several mu m.
                      Above the crack lines, the intensity of light is strongly
                      reduced. Beams of light are observed emerging from the edges
                      of the crack lines and propagate in air with heights of more
                      than 3 mu m. In between two different crack lines, periodic
                      repetitions of the beams are observed. These results are
                      interpreted as light diffraction on a microscopic scale.},
      keywords     = {J (WoSType)},
      cin          = {IEF-5},
      ddc          = {600},
      cid          = {I:(DE-Juel1)VDB813},
      pnm          = {Erneuerbare Energien},
      pid          = {G:(DE-Juel1)FUEK401},
      shelfmark    = {Engineering, Electrical $\&$ Electronic / Materials
                      Science, Multidisciplinary / Physics, Applied / Physics,
                      Condensed Matter},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000260288100041},
      doi          = {10.1007/s10854-008-9692-3},
      url          = {https://juser.fz-juelich.de/record/2874},
}