Home > Publications database > Influence of defects in opal photonic crystals on the optical transmission imaged by near-field scanning optical microscopy > print

001     2874
005     20240708133659.0
024 7 _ |2 DOI
|a 10.1007/s10854-008-9692-3
024 7 _ |2 WOS
|a WOS:000260288100041
037 _ _ |a PreJuSER-2874
041 _ _ |a eng
082 _ _ |a 600
084 _ _ |2 WoS
|a Engineering, Electrical & Electronic
084 _ _ |2 WoS
|a Materials Science, Multidisciplinary
084 _ _ |2 WoS
|a Physics, Applied
084 _ _ |2 WoS
|a Physics, Condensed Matter
100 1 _ |a Bittkau, K.
|b 0
|u FZJ
|0 P:(DE-Juel1)130219
245 _ _ |a Influence of defects in opal photonic crystals on the optical transmission imaged by near-field scanning optical microscopy
260 _ _ |a Dordrecht [u.a.]
|b Springer Science + Business Media B.V
|c 2008
300 _ _ |a 203 - 207
336 7 _ |a Journal Article
|0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
336 7 _ |a Output Types/Journal article
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336 7 _ |a Journal Article
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336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a article
|2 DRIVER
440 _ 0 |a Journal of Materials Science - Materials in Electronics
|x 0957-4522
|0 10182
|y Suppl. 1
|v 19
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a The electric field intensity above the surface of opal photonic crystals (PCs) and its alteration due to 'crystallographic' defects is investigated by using nearfield scanning optical microscopy (NSOM). The photonic crystals are developed by dip coating in a liquid solution with PMMA opals. Highly regular hexagonal planes with lattice constants of about 260 nm grow on the glass substrate. During the drying process several crack lines are formed that correspond to defects in the crystal structure. The transmitted light intensity at wavelengths inside and outside of the stop band of the PC is studied with NSOM using a tapered fiber tip scanning in all three dimensions. By this technique, a 3D image of the electric field intensity can be measured with a resolution better than 100 nm. The results show that the local optical field distribution is strongly dominated by the defect states in all directions in space over a length scale of several mu m. Above the crack lines, the intensity of light is strongly reduced. Beams of light are observed emerging from the edges of the crack lines and propagate in air with heights of more than 3 mu m. In between two different crack lines, periodic repetitions of the beams are observed. These results are interpreted as light diffraction on a microscopic scale.
536 _ _ |a Erneuerbare Energien
|c P11
|2 G:(DE-HGF)
|0 G:(DE-Juel1)FUEK401
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588 _ _ |a Dataset connected to Web of Science
650 _ 7 |a J
|2 WoSType
700 1 _ |a Carius, R.
|b 1
|u FZJ
|0 P:(DE-Juel1)VDB4964
700 1 _ |a Bielawny, A.
|b 2
|0 P:(DE-HGF)0
700 1 _ |a Wehrspohn, R. B.
|b 3
|0 P:(DE-HGF)0
773 _ _ |a 10.1007/s10854-008-9692-3
|g Vol. 19, p. 203 - 207
|p 203 - 207
|q 19<203 - 207
|0 PERI:(DE-600)2016994-2
|t Journal of materials science / Materials in electronics
|v 19
|y 2008
|x 0957-4522
856 7 _ |u http://dx.doi.org/10.1007/s10854-008-9692-3
909 C O |o oai:juser.fz-juelich.de:2874
|p VDB
913 1 _ |k P11
|v Erneuerbare Energien
|l Erneuerbare Energien
|b Energie
|0 G:(DE-Juel1)FUEK401
|x 0
914 1 _ |y 2008
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
920 1 _ |k IEF-5
|l Photovoltaik
|d 30.09.2010
|g IEF
|0 I:(DE-Juel1)VDB813
|x 0
970 _ _ |a VDB:(DE-Juel1)108047
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980 _ _ |a UNRESTRICTED
981 _ _ |a I:(DE-Juel1)IMD-3-20101013
981 _ _ |a I:(DE-Juel1)IEK-5-20101013

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