TY  - JOUR
AU  - Grossmann, M.
AU  - Lohse, O.
AU  - Bolten, D.
AU  - Böttger, U.
AU  - Waser, R.
AU  - Tiedke, S.
AU  - Schmitz, T.
AU  - Kall, U.
AU  - Kastner, M.
AU  - Schindler, G.
AU  - Hartner, W.
TI  - Influence of the measurement parameters on the reliability of ferroelectric thin films
JO  - Integrated ferroelectrics
VL  - 32
SN  - 1058-4587
CY  - London [u.a.]
PB  - Taylor & Francis
M1  - PreJuSER-29411
SP  - 1 - 9
PY  - 2001
N1  - Record converted from VDB: 12.11.2012
AB  - The fatigue behavior of PZT thin films was investigated. The fatigue excitation signal was changed with respect to the shape, the amplitude, and the frequency of the signal. It is shown that the fatigue excitation signal has a strong influence on the fatigue behavior of the films. Additionally, electrical characterization of a single 1 mum(2) SBT capacitor is reported.
KW  - J (WoSType)
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000167524400002
UR  - https://juser.fz-juelich.de/record/29411
ER  -