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@ARTICLE{Grossmann:29411,
author = {Grossmann, M. and Lohse, O. and Bolten, D. and Böttger, U.
and Waser, R. and Tiedke, S. and Schmitz, T. and Kall, U.
and Kastner, M. and Schindler, G. and Hartner, W.},
title = {{I}nfluence of the measurement parameters on the
reliability of ferroelectric thin films},
journal = {Integrated ferroelectrics},
volume = {32},
issn = {1058-4587},
address = {London [u.a.]},
publisher = {Taylor $\&$ Francis},
reportid = {PreJuSER-29411},
pages = {1 - 9},
year = {2001},
note = {Record converted from VDB: 12.11.2012},
abstract = {The fatigue behavior of PZT thin films was investigated.
The fatigue excitation signal was changed with respect to
the shape, the amplitude, and the frequency of the signal.
It is shown that the fatigue excitation signal has a strong
influence on the fatigue behavior of the films.
Additionally, electrical characterization of a single 1
mum(2) SBT capacitor is reported.},
keywords = {J (WoSType)},
cin = {IFF-EKM},
ddc = {620},
cid = {I:(DE-Juel1)VDB35},
pnm = {Festkörperforschung für die Informationstechnik},
pid = {G:(DE-Juel1)FUEK54},
shelfmark = {Engineering, Electrical $\&$ Electronic / Physics, Applied
/ Physics, Condensed Matter},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000167524400002},
url = {https://juser.fz-juelich.de/record/29411},
}