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001     29426
005     20180210131258.0
024 7 _ |2 DOI
|a 10.1080/10584580108222312
024 7 _ |2 WOS
|a WOS:000167524500032
037 _ _ |a PreJuSER-29426
041 _ _ |a eng
082 _ _ |a 620
084 _ _ |2 WoS
|a Engineering, Electrical & Electronic
084 _ _ |2 WoS
|a Physics, Applied
084 _ _ |2 WoS
|a Physics, Condensed Matter
100 1 _ |a Szot, K.
|0 P:(DE-Juel1)VDB2799
|b 0
|u FZJ
245 _ _ |a Segregation phenomena in thin films of BaTio3
260 _ _ |a London [u.a.]
|b Taylor & Francis
|c 2001
300 _ _ |a 303 -310
336 7 _ |a Journal Article
|0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|0 0
|2 EndNote
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a article
|2 DRIVER
440 _ 0 |a Integrated Ferroelectrics
|x 1058-4587
|0 2659
|v 33
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a The near-surface region in perovskite bulk crystals is known to be subject to segregation processes at elevated temperatures which can lead to the formation of non-perovskite phases. We have addressed the question whether analogue phenomena may occur in thin films, Thin films of BaTiO3 prepared by different methods (PLD, CSD) and heat-treated in the temperature range of 700 degreesC-1000 degreesC are characterised by surface analytical methods and microanalysis (AFM, SIMS, XPS). Our studies reveals dramatic changes in the surface morphology and in-depth elemental distribution suggesting a chemical restructuring comparable to the effects known for single crystalline BaTiO3. Possible driving forces for the observed segregation phenomena are discussed taking into account specific properties of the thin films.
536 _ _ |a Entwicklung analytischer Verfahren
|c 62.10.1
|2 G:(DE-HGF)
|0 G:(DE-Juel1)FUEK118
|x 0
536 _ _ |a Festkörperforschung für die Informationstechnik
|c 23.42.0
|0 G:(DE-Juel1)FUEK54
|x 1
588 _ _ |a Dataset connected to Web of Science
650 _ 7 |a J
|2 WoSType
653 2 0 |2 Author
|a thin films
653 2 0 |2 Author
|a surface layer
653 2 0 |2 Author
|a surface segregation
653 2 0 |2 Author
|a surface morphology
653 2 0 |2 Author
|a atomic force microscopy
700 1 _ |a Hoffmann, S.
|0 P:(DE-Juel1)VDB630
|b 1
|u FZJ
700 1 _ |a Speier, W.
|0 P:(DE-Juel1)125382
|b 2
|u FZJ
700 1 _ |a Breuer, U.
|0 P:(DE-Juel1)VDB2782
|b 3
|u FZJ
700 1 _ |a Siegert, M.
|0 P:(DE-Juel1)VDB2542
|b 4
|u FZJ
700 1 _ |a Waser, R.
|0 P:(DE-Juel1)131022
|b 5
|u FZJ
773 _ _ |a 10.1080/10584580108222312
|g Vol. 33, p. 303 -310
|p 303 -310
|q 33<303 -310
|0 PERI:(DE-600)2037916-X
|t Integrated ferroelectrics
|v 33
|y 2001
|x 1058-4587
909 C O |o oai:juser.fz-juelich.de:29426
|p VDB
913 1 _ |k 62.10.1
|v Entwicklung analytischer Verfahren
|l Werkstoffe der Energietechnik
|b Energietechnik
|0 G:(DE-Juel1)FUEK118
|x 0
913 1 _ |k 23.42.0
|v Festkörperforschung für die Informationstechnik
|l Grundlagenforschung zur Informationstechnik
|b Informationstechnik
|0 G:(DE-Juel1)FUEK54
|x 1
914 1 _ |y 2001
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
920 1 _ |k ZCH
|l Zentralabteilung für Chemische Analysen
|g ZCH
|0 I:(DE-Juel1)ZCH-20090406
|x 0
920 1 _ |k IFF-EKM
|l Elektrokeramische Materialien
|d 31.12.2003
|g IFF
|0 I:(DE-Juel1)VDB35
|x 1
970 _ _ |a VDB:(DE-Juel1)2631
980 _ _ |a VDB
980 _ _ |a ConvertedRecord
980 _ _ |a journal
980 _ _ |a I:(DE-Juel1)ZEA-3-20090406
980 _ _ |a I:(DE-Juel1)PGI-7-20110106
980 _ _ |a UNRESTRICTED
981 _ _ |a I:(DE-Juel1)ZEA-3-20090406
981 _ _ |a I:(DE-Juel1)PGI-7-20110106
981 _ _ |a I:(DE-Juel1)ZCH-20090406

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