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@ARTICLE{Pertsev:30053,
      author       = {Pertsev, N. A. and Kukhar, A. I. and Kohlstedt, H. and
                      Waser, R.},
      title        = {{P}hase diagrams and physical properties of single-domain
                      epitaxial {P}b({Z}r1-x{T}ix){O}3 thin films},
      journal      = {Physical review / B},
      volume       = {67},
      number       = {5},
      issn         = {0163-1829},
      address      = {College Park, Md.},
      publisher    = {APS},
      reportid     = {PreJuSER-30053},
      pages        = {054107},
      year         = {2003},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {The equilibrium polarization states and physical properties
                      of single-domain Pb(Zr1-xTix)O-3 (PZT) thin films
                      epitaxially grown on dissimilar cubic substrates have been
                      examined by a nonlinear thermodynamic theory. In contrast to
                      the former theoretical studies of PZT films, the
                      two-dimensional straining and clamping of a film by a thick
                      substrate is correctly taken into account in the reported
                      calculations. The "misfit strain-temperature" phase diagrams
                      are developed for PZT films of several different
                      compositions (x=0.9, 0.8, 0.7, 0.6, 0.5, and 0.4). The
                      characteristic feature of these diagrams is the presence of
                      a "monoclinic gap" separating the stability ranges of the
                      tetragonal out-of-plane and the orthorhombic in-plane
                      polarization states. It is found that this gap widens with
                      the increase of Zr content, and its center shifts from
                      positive values of the misfit strain towards zero. The
                      dependences of the polarization components on the misfit
                      strain and composition at the room temperature are
                      calculated and compared with the available experimental
                      data. The small-signal dielectric and piezoelectric
                      responses of single-domain PZT films are also determined,
                      and their misfit-strain dependence is discussed.},
      keywords     = {J (WoSType)},
      cin          = {IFF-EKM},
      ddc          = {530},
      cid          = {I:(DE-Juel1)VDB35},
      pnm          = {Materialien, Prozesse und Bauelemente für die Mikro- und
                      Nanoelektronik},
      pid          = {G:(DE-Juel1)FUEK252},
      shelfmark    = {Physics, Condensed Matter},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000181360300029},
      doi          = {10.1103/PhysRevB.67.054107},
      url          = {https://juser.fz-juelich.de/record/30053},
}