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000030093 084__ $$2WoS$$aCrystallography
000030093 084__ $$2WoS$$aMaterials Science, Multidisciplinary
000030093 084__ $$2WoS$$aPhysics, Applied
000030093 1001_ $$0P:(DE-Juel1)VDB5020$$aJia, C. L.$$b0$$uFZJ
000030093 245__ $$aIntroduction and characterization of interfacial defects in SrRuO3/BaTiO3/SrRuO3 multilayer films
000030093 260__ $$aAmsterdam [u.a.]$$bElsevier$$c2003
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000030093 440_0 $$03235$$aJournal of Crystal Growth$$v247$$x0022-0248
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000030093 520__ $$aA Ruddlesden-Popper-type planar fault was introduced at the SrRuO3/BaTiO3 interface of a SrRuO3/BaTiO3/ SrRuO3 heterofilm system using different processing conditions for the individual film layer. This fault occurs continuously and homogeneously along the interface, forming an extra Sr-rich sub-nanometer layer. The structure of the fault and the lattice behavior in the interface area were characterized on an atomic scale by properly imaging all types of atomic columns, especially the pure oxygen columns, by means of spherical-aberration-corrected high-resolution transmission electron microscopy. Information on local interdiffusion and lattice strain at the interface was obtained by quantitative evaluation of the atomic resolution images.' (C) 2002 Elsevier Science B.V. All rights reserved.
000030093 536__ $$0G:(DE-Juel1)FUEK252$$2G:(DE-HGF)$$aMaterialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik$$cI01$$x0
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000030093 65320 $$2Author$$ahigh resolution transmission electron microscopy
000030093 65320 $$2Author$$ainterfaces
000030093 65320 $$2Author$$aRuddlesden-Popper-Type planar fault
000030093 65320 $$2Author$$aSrRuO3/BaTiO3 heterofilm
000030093 65320 $$2Author$$aperovskites
000030093 7001_ $$0P:(DE-Juel1)VDB5562$$aRodriguez Contreras, J.$$b1$$uFZJ
000030093 7001_ $$0P:(DE-Juel1)128631$$aSchubert, J.$$b2$$uFZJ
000030093 7001_ $$0P:(DE-Juel1)VDB5034$$aLentzen, M.$$b3$$uFZJ
000030093 7001_ $$0P:(DE-Juel1)VDB21377$$aPoppe, U.$$b4$$uFZJ
000030093 7001_ $$0P:(DE-Juel1)VDB3107$$aKohlstedt, H.$$b5$$uFZJ
000030093 7001_ $$0P:(DE-Juel1)VDB4950$$aUrban, K.$$b6$$uFZJ
000030093 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b7$$uFZJ
000030093 773__ $$0PERI:(DE-600)1466514-1$$a10.1016/S0022-0248(02)01985-1$$gVol. 247, p. 381$$p381$$q247<381$$tJournal of crystal growth$$v247$$x0022-0248$$y2003
000030093 8567_ $$uhttp://dx.doi.org/10.1016/S0022-0248(02)01985-1
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