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@ARTICLE{Jia:30093,
      author       = {Jia, C. L. and Rodriguez Contreras, J. and Schubert, J. and
                      Lentzen, M. and Poppe, U. and Kohlstedt, H. and Urban, K.
                      and Waser, R.},
      title        = {{I}ntroduction and characterization of interfacial defects
                      in {S}r{R}u{O}3/{B}a{T}i{O}3/{S}r{R}u{O}3 multilayer films},
      journal      = {Journal of crystal growth},
      volume       = {247},
      issn         = {0022-0248},
      address      = {Amsterdam [u.a.]},
      publisher    = {Elsevier},
      reportid     = {PreJuSER-30093},
      pages        = {381},
      year         = {2003},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {A Ruddlesden-Popper-type planar fault was introduced at the
                      SrRuO3/BaTiO3 interface of a SrRuO3/BaTiO3/ SrRuO3
                      heterofilm system using different processing conditions for
                      the individual film layer. This fault occurs continuously
                      and homogeneously along the interface, forming an extra
                      Sr-rich sub-nanometer layer. The structure of the fault and
                      the lattice behavior in the interface area were
                      characterized on an atomic scale by properly imaging all
                      types of atomic columns, especially the pure oxygen columns,
                      by means of spherical-aberration-corrected high-resolution
                      transmission electron microscopy. Information on local
                      interdiffusion and lattice strain at the interface was
                      obtained by quantitative evaluation of the atomic resolution
                      images.' (C) 2002 Elsevier Science B.V. All rights
                      reserved.},
      keywords     = {J (WoSType)},
      cin          = {IFF-EKM / IFF-IMF / ISG-1},
      ddc          = {540},
      cid          = {I:(DE-Juel1)VDB35 / I:(DE-Juel1)VDB37 / I:(DE-Juel1)VDB41},
      pnm          = {Materialien, Prozesse und Bauelemente für die Mikro- und
                      Nanoelektronik / Kondensierte Materie},
      pid          = {G:(DE-Juel1)FUEK252 / G:(DE-Juel1)FUEK242},
      shelfmark    = {Crystallography / Materials Science, Multidisciplinary /
                      Physics, Applied},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000180362900018},
      doi          = {10.1016/S0022-0248(02)01985-1},
      url          = {https://juser.fz-juelich.de/record/30093},
}