000030171 001__ 30171
000030171 005__ 20200423203515.0
000030171 017__ $$aThis version is available at the following Publisher URL: http://apl.aip.org
000030171 0247_ $$2DOI$$a10.1063/1.1526926
000030171 0247_ $$2WOS$$aWOS:000179481900033
000030171 0247_ $$2Handle$$a2128/1229
000030171 037__ $$aPreJuSER-30171
000030171 041__ $$aeng
000030171 082__ $$a530
000030171 084__ $$2WoS$$aPhysics, Applied
000030171 1001_ $$0P:(DE-HGF)0$$aMoert, M.$$b0
000030171 245__ $$aKinetic of phase transformation of SrBi2Ta2O9 deposited by metalorganic decomposition on platinum electrodes
000030171 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2002
000030171 300__ $$a4410
000030171 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article
000030171 3367_ $$2DataCite$$aOutput Types/Journal article
000030171 3367_ $$00$$2EndNote$$aJournal Article
000030171 3367_ $$2BibTeX$$aARTICLE
000030171 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000030171 3367_ $$2DRIVER$$aarticle
000030171 440_0 $$0562$$aApplied Physics Letters$$v81$$x0003-6951
000030171 500__ $$aRecord converted from VDB: 12.11.2012
000030171 520__ $$aSrBi2Ta2O9 thin films were prepared by metalorganic decomposition on Pt/Ti/SiO2/Si substrates and subsequently crystallized at temperatures ranging from 600 to 700 degreesC for 40 to 225 min. Data of the Aurivillius surface coverage taken from atomic force microscopy measurements were used to model the kinetics of isothermal phase transformation from the fluorite to the Aurivillius phase. A two-dimensional growth mechanism at a decreasing nucleation rate can be deduced. By evaluating the temperature dependence of the growth rates, an activation energy for phase transformation of 318 kJ/mol is determined. (C) 2002 American Institute of Physics.
000030171 536__ $$0G:(DE-Juel1)FUEK252$$2G:(DE-HGF)$$aMaterialien, Prozesse und Bauelemente für die  Mikro- und Nanoelektronik$$cI01$$x0
000030171 588__ $$aDataset connected to Web of Science
000030171 650_7 $$2WoSType$$aJ
000030171 7001_ $$0P:(DE-Juel1)VDB22105$$aMikolajick, D. A. B.$$b1$$uFZJ
000030171 7001_ $$0P:(DE-HGF)0$$aSchindler, G.$$b2
000030171 7001_ $$0P:(DE-HGF)0$$aNagel, D. R.$$b3
000030171 7001_ $$0P:(DE-HGF)0$$aHartner, W.$$b4
000030171 7001_ $$0P:(DE-HGF)0$$aDehm, C.$$b5
000030171 7001_ $$0P:(DE-Juel1)VDB3107$$aKohlstedt, H.$$b6$$uFZJ
000030171 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b7$$uFZJ
000030171 773__ $$0PERI:(DE-600)1469436-0$$a10.1063/1.1526926$$gVol. 81, p. 4410$$p4410$$q81<4410$$tApplied physics letters$$v81$$x0003-6951$$y2002
000030171 8564_ $$uhttps://juser.fz-juelich.de/record/30171/files/27656.pdf$$yOpenAccess
000030171 8564_ $$uhttps://juser.fz-juelich.de/record/30171/files/27656.jpg?subformat=icon-1440$$xicon-1440$$yOpenAccess
000030171 8564_ $$uhttps://juser.fz-juelich.de/record/30171/files/27656.jpg?subformat=icon-180$$xicon-180$$yOpenAccess
000030171 8564_ $$uhttps://juser.fz-juelich.de/record/30171/files/27656.jpg?subformat=icon-640$$xicon-640$$yOpenAccess
000030171 909CO $$ooai:juser.fz-juelich.de:30171$$pdnbdelivery$$pVDB$$pdriver$$popen_access$$popenaire
000030171 9131_ $$0G:(DE-Juel1)FUEK252$$bInformation$$kI01$$lInformationstechnologie mit nanoelektronischen Systemen$$vMaterialien, Prozesse und Bauelemente für die  Mikro- und Nanoelektronik$$x0
000030171 9141_ $$aNachtrag$$y2002
000030171 915__ $$0StatID:(DE-HGF)0010$$aJCR/ISI refereed
000030171 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000030171 9201_ $$0I:(DE-Juel1)VDB35$$d31.12.2003$$gIFF$$kIFF-EKM$$lElektrokeramische Materialien$$x0
000030171 970__ $$aVDB:(DE-Juel1)27656
000030171 980__ $$aVDB
000030171 980__ $$aJUWEL
000030171 980__ $$aConvertedRecord
000030171 980__ $$ajournal
000030171 980__ $$aI:(DE-Juel1)PGI-7-20110106
000030171 980__ $$aUNRESTRICTED
000030171 980__ $$aFullTexts
000030171 9801_ $$aFullTexts
000030171 981__ $$aI:(DE-Juel1)PGI-7-20110106