% IMPORTANT: The following is UTF-8 encoded.  This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.

@ARTICLE{Bolten:30190,
      author       = {Bolten, D. and Böttger, U. and Waser, R.},
      title        = {{R}eversible and irreversible polarization processes in
                      ferroelectric ceramics and thin films},
      journal      = {Journal of applied physics},
      volume       = {93},
      issn         = {0021-8979},
      address      = {Melville, NY},
      publisher    = {American Institute of Physics},
      reportid     = {PreJuSER-30190},
      pages        = {1735 - 1742},
      year         = {2003},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {In this article, the separation between reversible and
                      irreversible polarization where the reversible polarization
                      component is determined by capacitance-voltage, curve
                      measurements, is used to characterize ferroelectric
                      materials. After giving a thorough foundation of the method,
                      it is used to investigate the influence of the composition
                      on the reversible and irreversible polarization
                      contributions in ferroelectric thin films and/or bulk
                      ceramics. The reversible polarization is also monitored
                      during fatigue. A comparison to bulk ceramics suggests that
                      the domain wall motion in ferroelectric thin films is
                      reduced compared to bulk ceramics. (C) 2003 American
                      Institute of Physics. [DOI:10.1063/1.1535748].},
      keywords     = {J (WoSType)},
      cin          = {IFF-EKM},
      ddc          = {530},
      cid          = {I:(DE-Juel1)VDB35},
      pnm          = {Materialien, Prozesse und Bauelemente für die Mikro- und
                      Nanoelektronik},
      pid          = {G:(DE-Juel1)FUEK252},
      shelfmark    = {Physics, Applied},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000180630200064},
      doi          = {10.1063/1.1535748},
      url          = {https://juser.fz-juelich.de/record/30190},
}