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017 _ _ |a This version is available at the following Publisher URL: http://jap.aip.org
024 7 _ |a 10.1063/1.1535748
|2 DOI
024 7 _ |a WOS:000180630200064
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024 7 _ |a 2128/1232
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037 _ _ |a PreJuSER-30190
041 _ _ |a eng
082 _ _ |a 530
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|a Physics, Applied
100 1 _ |a Bolten, D.
|b 0
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245 _ _ |a Reversible and irreversible polarization processes in ferroelectric ceramics and thin films
260 _ _ |a Melville, NY
|b American Institute of Physics
|c 2003
300 _ _ |a 1735 - 1742
336 7 _ |a Journal Article
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336 7 _ |a article
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440 _ 0 |a Journal of Applied Physics
|x 0021-8979
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|v 93
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a In this article, the separation between reversible and irreversible polarization where the reversible polarization component is determined by capacitance-voltage, curve measurements, is used to characterize ferroelectric materials. After giving a thorough foundation of the method, it is used to investigate the influence of the composition on the reversible and irreversible polarization contributions in ferroelectric thin films and/or bulk ceramics. The reversible polarization is also monitored during fatigue. A comparison to bulk ceramics suggests that the domain wall motion in ferroelectric thin films is reduced compared to bulk ceramics. (C) 2003 American Institute of Physics. [DOI:10.1063/1.1535748].
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700 1 _ |a Böttger, U.
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700 1 _ |a Waser, R.
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773 _ _ |a 10.1063/1.1535748
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856 7 _ |u http://dx.doi.org/10.1063/1.1535748
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