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@ARTICLE{Jin:30360,
author = {Jin, H. Z. and Zhu, J. and Erhart, P. and Jia, C. L. and
Regnery, S. and Urban, K. and Waser, R.},
title = {{A}n interfacial defect layer observed at
({B}a,{S}r){T}i{O}3/{P}t interface},
journal = {Thin solid films},
volume = {429},
issn = {0040-6090},
address = {Amsterdam [u.a.]},
publisher = {Elsevier},
reportid = {PreJuSER-30360},
pages = {282 - 285},
year = {2003},
note = {Record converted from VDB: 12.11.2012},
abstract = {Barium strontium titanate (Ba,Sr)TiO3 (BST) thin-films on
Pt-substrates were studied by transmission electron
microscopy. The films show a columnar structure with the
grains of 10-50 nm in diameter. These are oriented parallel
to the [0 0 1] direction which in turn is parallel to the
film growth direction. No amorphous intergrain regions
occur. The high-resolution lattice fringe pictures show for
the first time that over horizontally extended areas of the
interface the lattice of the BST film is modified by the
introduction of a defect layer. This observation is
discussed in terms of a structural origin of the so-called
dead-layer effect responsible for a reduction of the film
permittivity with decreasing foil thickness. (C) 2003
Elsevier Science B.V. All rights reserved.},
keywords = {J (WoSType)},
cin = {IFF-EKM / IFF-IMF},
ddc = {070},
cid = {I:(DE-Juel1)VDB35 / I:(DE-Juel1)VDB37},
pnm = {Materialien, Prozesse und Bauelemente für die Mikro- und
Nanoelektronik / Kondensierte Materie},
pid = {G:(DE-Juel1)FUEK252 / G:(DE-Juel1)FUEK242},
shelfmark = {Materials Science, Multidisciplinary / Materials Science,
Coatings $\&$ Films / Physics, Applied / Physics, Condensed
Matter},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000182647900042},
doi = {10.1016/S0040-6090(02)01330-5},
url = {https://juser.fz-juelich.de/record/30360},
}