Hauptseite > Publikationsdatenbank > An interfacial defect layer observed at (Ba,Sr)TiO3/Pt interface > print

001     30360
005     20240610121316.0
024 7 _ |2 DOI
|a 10.1016/S0040-6090(02)01330-5
024 7 _ |2 WOS
|a WOS:000182647900042
037 _ _ |a PreJuSER-30360
041 _ _ |a eng
082 _ _ |a 070
084 _ _ |2 WoS
|a Materials Science, Multidisciplinary
084 _ _ |2 WoS
|a Materials Science, Coatings & Films
084 _ _ |2 WoS
|a Physics, Applied
084 _ _ |2 WoS
|a Physics, Condensed Matter
100 1 _ |a Jin, H. Z.
|b 0
|0 P:(DE-HGF)0
245 _ _ |a An interfacial defect layer observed at (Ba,Sr)TiO3/Pt interface
260 _ _ |a Amsterdam [u.a.]
|b Elsevier
|c 2003
300 _ _ |a 282 - 285
336 7 _ |a Journal Article
|0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|0 0
|2 EndNote
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a article
|2 DRIVER
440 _ 0 |a Thin Solid Films
|x 0040-6090
|0 5762
|v 429
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a Barium strontium titanate (Ba,Sr)TiO3 (BST) thin-films on Pt-substrates were studied by transmission electron microscopy. The films show a columnar structure with the grains of 10-50 nm in diameter. These are oriented parallel to the [0 0 1] direction which in turn is parallel to the film growth direction. No amorphous intergrain regions occur. The high-resolution lattice fringe pictures show for the first time that over horizontally extended areas of the interface the lattice of the BST film is modified by the introduction of a defect layer. This observation is discussed in terms of a structural origin of the so-called dead-layer effect responsible for a reduction of the film permittivity with decreasing foil thickness. (C) 2003 Elsevier Science B.V. All rights reserved.
536 _ _ |a Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
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536 _ _ |a Kondensierte Materie
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588 _ _ |a Dataset connected to Web of Science
650 _ 7 |a J
|2 WoSType
653 2 0 |2 Author
|a transmission electron microscopy
653 2 0 |2 Author
|a interfacial defect layer
653 2 0 |2 Author
|a barium strontium titanate
653 2 0 |2 Author
|a high-density storage
700 1 _ |a Zhu, J.
|b 1
|0 P:(DE-HGF)0
700 1 _ |a Erhart, P.
|b 2
|u FZJ
|0 P:(DE-Juel1)VDB22206
700 1 _ |a Jia, C. L.
|b 3
|u FZJ
|0 P:(DE-Juel1)VDB5020
700 1 _ |a Regnery, S.
|b 4
|0 P:(DE-HGF)0
700 1 _ |a Urban, K.
|b 5
|u FZJ
|0 P:(DE-Juel1)VDB4950
700 1 _ |a Waser, R.
|b 6
|u FZJ
|0 P:(DE-Juel1)131022
773 _ _ |a 10.1016/S0040-6090(02)01330-5
|g Vol. 429, p. 282 - 285
|p 282 - 285
|q 429<282 - 285
|0 PERI:(DE-600)1482896-0
|t Thin solid films
|v 429
|y 2003
|x 0040-6090
856 7 _ |u http://dx.doi.org/10.1016/S0040-6090(02)01330-5
909 C O |o oai:juser.fz-juelich.de:30360
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913 1 _ |k I01
|v Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
|l Informationstechnologie mit nanoelektronischen Systemen
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914 1 _ |y 2003
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
920 1 _ |k IFF-EKM
|l Elektrokeramische Materialien
|d 31.12.2003
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920 1 _ |k IFF-IMF
|l Mikrostrukturforschung
|d 31.12.2006
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981 _ _ |a I:(DE-Juel1)ER-C-1-20170209
981 _ _ |a I:(DE-Juel1)PGI-7-20110106
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