000031695 001__ 31695
000031695 005__ 20200423203540.0
000031695 017__ $$aThis version is available at the following Publisher URL: http://jap.aip.org
000031695 0247_ $$2Handle$$a2128/1237
000031695 0247_ $$2URI$$a1237
000031695 0247_ $$2ISSN$$a0021-8979
000031695 037__ $$aPreJuSER-31695
000031695 082__ $$a530
000031695 1001_ $$0P:(DE-HGF)0$$aGrossmann, M.$$b0
000031695 245__ $$aThe interface screening model as origin of imprint in PbZrxTi1-xO3 thin films. II. Numerical simulation and verification
000031695 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2002
000031695 300__ $$a2688 - 2696
000031695 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article
000031695 3367_ $$2DataCite$$aOutput Types/Journal article
000031695 3367_ $$00$$2EndNote$$aJournal Article
000031695 3367_ $$2BibTeX$$aARTICLE
000031695 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000031695 3367_ $$2DRIVER$$aarticle
000031695 440_0 $$03051$$aJournal of Applied Physics$$v92$$x0021-8979
000031695 500__ $$aRecord converted from VDB: 12.11.2012
000031695 536__ $$0G:(DE-Juel1)FUEK252$$2G:(DE-HGF)$$aMaterialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik$$cI01$$x0
000031695 7001_ $$0P:(DE-HGF)0$$aLohse, O.$$b1
000031695 7001_ $$0P:(DE-HGF)0$$aBolten, D.$$b2
000031695 7001_ $$0P:(DE-HGF)0$$aBöttger, U.$$b3
000031695 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b4$$uFZJ
000031695 773__ $$0PERI:(DE-600)1476463-5$$gVol. 92, p. 2688 - 2696$$p2688 - 2696$$q92<2688 - 2696$$tJournal of applied physics$$v92$$x0021-8979$$y2002
000031695 8564_ $$uhttps://juser.fz-juelich.de/record/31695/files/33394.pdf$$yOpenAccess
000031695 8564_ $$uhttps://juser.fz-juelich.de/record/31695/files/33394.jpg?subformat=icon-1440$$xicon-1440$$yOpenAccess
000031695 8564_ $$uhttps://juser.fz-juelich.de/record/31695/files/33394.jpg?subformat=icon-180$$xicon-180$$yOpenAccess
000031695 8564_ $$uhttps://juser.fz-juelich.de/record/31695/files/33394.jpg?subformat=icon-640$$xicon-640$$yOpenAccess
000031695 909CO $$ooai:juser.fz-juelich.de:31695$$pdnbdelivery$$pVDB$$pdriver$$popen_access$$popenaire
000031695 9131_ $$0G:(DE-Juel1)FUEK252$$bInformation$$kI01$$lInformationstechnologie mit nanoelektronischen Systemen$$vMaterialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik$$x0
000031695 9141_ $$aNachtrag$$y2002
000031695 915__ $$0StatID:(DE-HGF)0010$$aJCR/ISI refereed
000031695 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000031695 9201_ $$0I:(DE-Juel1)VDB35$$d31.12.2003$$gIFF$$kIFF-EKM$$lElektrokeramische Materialien$$x0
000031695 970__ $$aVDB:(DE-Juel1)33394
000031695 980__ $$aVDB
000031695 980__ $$aJUWEL
000031695 980__ $$aConvertedRecord
000031695 980__ $$ajournal
000031695 980__ $$aI:(DE-Juel1)PGI-7-20110106
000031695 980__ $$aUNRESTRICTED
000031695 980__ $$aFullTexts
000031695 9801_ $$aFullTexts
000031695 981__ $$aI:(DE-Juel1)PGI-7-20110106