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@ARTICLE{Grossmann:31695,
      author       = {Grossmann, M. and Lohse, O. and Bolten, D. and Böttger, U.
                      and Waser, R.},
      title        = {{T}he interface screening model as origin of imprint in
                      {P}b{Z}rx{T}i1-x{O}3 thin films. {II}. {N}umerical
                      simulation and verification},
      journal      = {Journal of applied physics},
      volume       = {92},
      issn         = {0021-8979},
      address      = {Melville, NY},
      publisher    = {American Institute of Physics},
      reportid     = {PreJuSER-31695},
      pages        = {2688 - 2696},
      year         = {2002},
      note         = {Record converted from VDB: 12.11.2012},
      cin          = {IFF-EKM},
      ddc          = {530},
      cid          = {I:(DE-Juel1)VDB35},
      pnm          = {Materialien, Prozesse und Bauelemente für die Mikro- und
                      Nanoelektronik},
      pid          = {G:(DE-Juel1)FUEK252},
      typ          = {PUB:(DE-HGF)16},
      url          = {https://juser.fz-juelich.de/record/31695},
}