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005     20200423203540.0
017 _ _ |a This version is available at the following Publisher URL: http://jap.aip.org
024 7 _ |a 2128/1237
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024 7 _ |a 1237
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024 7 _ |a 0021-8979
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037 _ _ |a PreJuSER-31695
082 _ _ |a 530
100 1 _ |a Grossmann, M.
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245 _ _ |a The interface screening model as origin of imprint in PbZrxTi1-xO3 thin films. II. Numerical simulation and verification
260 _ _ |a Melville, NY
|b American Institute of Physics
|c 2002
300 _ _ |a 2688 - 2696
336 7 _ |a Journal Article
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440 _ 0 |a Journal of Applied Physics
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536 _ _ |a Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
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700 1 _ |a Lohse, O.
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700 1 _ |a Bolten, D.
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700 1 _ |a Böttger, U.
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700 1 _ |a Waser, R.
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773 _ _ |g Vol. 92, p. 2688 - 2696
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