%0 Journal Article
%A Gerber, P.
%A Roelofs, A.
%A Lohse, O.
%A Kügeler, C.
%A Tiedke, S.
%A Böttger, U.
%A Waser, R.
%T Short-time piezoelectric measurements in ferroelectric thin films using a double-beam laser interferometer
%J Review of scientific instruments
%V 74
%@ 0034-6748
%C [S.l.]
%I American Institute of Physics
%M PreJuSER-32000
%P 2613 - 2615
%D 2003
%Z Record converted from VDB: 12.11.2012
%X An evolution of the double-beam laser interferometer used for piezoelectric measurements in ferroelectric thin films is reported. Measuring the d(33) hysteresis of a ferroelectric material using lock-in technique with large time constants requires a varying bias field to be applied to the sample over a long period of time. This long-term application leads to electrical stress during the measurement. We present a measurement technique using a different source for the applied field and a varied method for averaging the interferometric response. The measurement time for a complete d(33) hysteresis will be shortened down to several seconds. Also, the cycle frequency becomes comparable to electrical hysteresis measurements. Experimental results on quartz and Pb(Zr-(X),Ti(1-X))O-3 are given to demonstrate the capabilities of the interferometer and the new measurement method. (C) 2003 American Institute of Physics.
%K J (WoSType)
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000181829000053
%R 10.1063/1.1544415
%U https://juser.fz-juelich.de/record/32000