TY  - JOUR
AU  - Gerber, P.
AU  - Roelofs, A.
AU  - Lohse, O.
AU  - Kügeler, C.
AU  - Tiedke, S.
AU  - Böttger, U.
AU  - Waser, R.
TI  - Short-time piezoelectric measurements in ferroelectric thin films using a double-beam laser interferometer
JO  - Review of scientific instruments
VL  - 74
SN  - 0034-6748
CY  - [S.l.]
PB  - American Institute of Physics
M1  - PreJuSER-32000
SP  - 2613 - 2615
PY  - 2003
N1  - Record converted from VDB: 12.11.2012
AB  - An evolution of the double-beam laser interferometer used for piezoelectric measurements in ferroelectric thin films is reported. Measuring the d(33) hysteresis of a ferroelectric material using lock-in technique with large time constants requires a varying bias field to be applied to the sample over a long period of time. This long-term application leads to electrical stress during the measurement. We present a measurement technique using a different source for the applied field and a varied method for averaging the interferometric response. The measurement time for a complete d(33) hysteresis will be shortened down to several seconds. Also, the cycle frequency becomes comparable to electrical hysteresis measurements. Experimental results on quartz and Pb(Zr-(X),Ti(1-X))O-3 are given to demonstrate the capabilities of the interferometer and the new measurement method. (C) 2003 American Institute of Physics.
KW  - J (WoSType)
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000181829000053
DO  - DOI:10.1063/1.1544415
UR  - https://juser.fz-juelich.de/record/32000
ER  -