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| 001 | 32000 | ||
| 005 | 20200423203543.0 | ||
| 017 | _ | _ | |a This version is available at the following Publisher URL: http://rsi.aip.org |
| 024 | 7 | _ | |a 10.1063/1.1544415 |2 DOI |
| 024 | 7 | _ | |a WOS:000181829000053 |2 WOS |
| 024 | 7 | _ | |a 2128/1238 |2 Handle |
| 037 | _ | _ | |a PreJuSER-32000 |
| 041 | _ | _ | |a eng |
| 082 | _ | _ | |a 530 |
| 084 | _ | _ | |2 WoS |a Instruments & Instrumentation |
| 084 | _ | _ | |2 WoS |a Physics, Applied |
| 100 | 1 | _ | |a Gerber, P. |b 0 |0 P:(DE-HGF)0 |
| 245 | _ | _ | |a Short-time piezoelectric measurements in ferroelectric thin films using a double-beam laser interferometer |
| 260 | _ | _ | |a [S.l.] |b American Institute of Physics |c 2003 |
| 300 | _ | _ | |a 2613 - 2615 |
| 336 | 7 | _ | |a Journal Article |0 PUB:(DE-HGF)16 |2 PUB:(DE-HGF) |
| 336 | 7 | _ | |a Output Types/Journal article |2 DataCite |
| 336 | 7 | _ | |a Journal Article |0 0 |2 EndNote |
| 336 | 7 | _ | |a ARTICLE |2 BibTeX |
| 336 | 7 | _ | |a JOURNAL_ARTICLE |2 ORCID |
| 336 | 7 | _ | |a article |2 DRIVER |
| 440 | _ | 0 | |a Review of Scientific Instruments |x 0034-6748 |0 5309 |v 74 |
| 500 | _ | _ | |a Record converted from VDB: 12.11.2012 |
| 520 | _ | _ | |a An evolution of the double-beam laser interferometer used for piezoelectric measurements in ferroelectric thin films is reported. Measuring the d(33) hysteresis of a ferroelectric material using lock-in technique with large time constants requires a varying bias field to be applied to the sample over a long period of time. This long-term application leads to electrical stress during the measurement. We present a measurement technique using a different source for the applied field and a varied method for averaging the interferometric response. The measurement time for a complete d(33) hysteresis will be shortened down to several seconds. Also, the cycle frequency becomes comparable to electrical hysteresis measurements. Experimental results on quartz and Pb(Zr-(X),Ti(1-X))O-3 are given to demonstrate the capabilities of the interferometer and the new measurement method. (C) 2003 American Institute of Physics. |
| 536 | _ | _ | |a Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik |c I01 |2 G:(DE-HGF) |0 G:(DE-Juel1)FUEK252 |x 0 |
| 588 | _ | _ | |a Dataset connected to Web of Science |
| 650 | _ | 7 | |a J |2 WoSType |
| 700 | 1 | _ | |a Roelofs, A. |b 1 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Lohse, O. |b 2 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Kügeler, C. |b 3 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Tiedke, S. |b 4 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Böttger, U. |b 5 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Waser, R. |b 6 |u FZJ |0 P:(DE-Juel1)131022 |
| 773 | _ | _ | |a 10.1063/1.1544415 |g Vol. 74, p. 2613 - 2615 |p 2613 - 2615 |q 74<2613 - 2615 |0 PERI:(DE-600)1472905-2 |t Review of scientific instruments |v 74 |y 2003 |x 0034-6748 |
| 856 | 7 | _ | |u http://dx.doi.org/10.1063/1.1544415 |u http://hdl.handle.net/2128/1238 |
| 856 | 4 | _ | |u https://juser.fz-juelich.de/record/32000/files/33401.pdf |y OpenAccess |
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| 856 | 4 | _ | |u https://juser.fz-juelich.de/record/32000/files/33401.jpg?subformat=icon-640 |x icon-640 |y OpenAccess |
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| 913 | 1 | _ | |k I01 |v Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik |l Informationstechnologie mit nanoelektronischen Systemen |b Information |0 G:(DE-Juel1)FUEK252 |x 0 |
| 914 | 1 | _ | |y 2003 |
| 915 | _ | _ | |0 StatID:(DE-HGF)0010 |a JCR/ISI refereed |
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| 920 | 1 | _ | |k IFF-EKM |l Elektrokeramische Materialien |d 31.12.2003 |g IFF |0 I:(DE-Juel1)VDB35 |x 0 |
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