001     32034
005     20250701125909.0
024 7 _ |2 DOI
|a 10.1088/0953-2048/17/5/020
024 7 _ |2 WOS
|a WOS:000221792700021
037 _ _ |a PreJuSER-32034
041 _ _ |a eng
082 _ _ |a 530
084 _ _ |2 WoS
|a Physics, Applied
084 _ _ |2 WoS
|a Physics, Condensed Matter
100 1 _ |a Poppe, U.
|b 0
|u FZJ
|0 P:(DE-Juel1)VDB21377
245 _ _ |a High temperature superconductor dc-SQUID microscope with a soft magnetic flux guide
260 _ _ |a Bristol
|b IOP Publ.
|c 2004
300 _ _ |a s191 - s195
336 7 _ |a Journal Article
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336 7 _ |a Journal Article
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336 7 _ |a ARTICLE
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336 7 _ |a JOURNAL_ARTICLE
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336 7 _ |a article
|2 DRIVER
440 _ 0 |a Superconductor Science and Technology
|x 0953-2048
|0 5665
|v 17
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a A scanning SQUID microscope based on high-temperature superconductor (FITS) dc-SQUIDs was developed. An extremely soft magnetic amorphous foil was used to guide the flux from room temperature samples to the liquid-nitrogen-cooled SQUID sensor and back. The flux guide passes through the pick-up loop of the HTS SQUID, providing an improved coupling of magnetic flux of the object to the SQUID. The device measures the z component (direction perpendicular to the sample surface) of the stray field of the sample, which is rastered with submicron precision in the x-y direction by a motorized computer-controlled scanning stage. A lateral resolution better than 10 mum, with a field resolution of about 0.6 nT Hz(-1/2) was achieved for the determination of the position of the current carrying thin wires. The presence of the soft magnetic foil did not significantly increase the flux noise of the SQUID.
536 _ _ |a Kondensierte Materie
|c M02
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588 _ _ |a Dataset connected to Web of Science
650 _ 7 |a J
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700 1 _ |a Faley, M.
|b 1
|u FZJ
|0 P:(DE-Juel1)130633
700 1 _ |a Zimmermann, E.
|b 2
|u FZJ
|0 P:(DE-Juel1)133962
700 1 _ |a Glaas, W.
|b 3
|u FZJ
|0 P:(DE-Juel1)133890
700 1 _ |a Breunig, I.
|b 4
|u FZJ
|0 P:(DE-Juel1)VDB25940
700 1 _ |a Speen, J. R.
|b 5
|u FZJ
|0 P:(DE-Juel1)VDB25941
700 1 _ |a Jungbluth, B.
|b 6
|0 P:(DE-HGF)0
700 1 _ |a Soltner, H.
|b 7
|u FZJ
|0 P:(DE-Juel1)VDB4093
700 1 _ |a Halling, H.
|b 8
|u FZJ
|0 P:(DE-Juel1)VDB2000
700 1 _ |a Urban, K.
|b 9
|u FZJ
|0 P:(DE-Juel1)VDB4950
773 _ _ |a 10.1088/0953-2048/17/5/020
|g Vol. 17, p. s191 - s195
|p s191 - s195
|q 17|0 PERI:(DE-600)1361475-7
|t Superconductor science and technology
|v 17
|y 2004
|x 0953-2048
856 7 _ |u http://dx.doi.org/10.1088/0953-2048/17/5/020
909 C O |o oai:juser.fz-juelich.de:32034
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913 1 _ |k M02
|v Kondensierte Materie
|l Kondensierte Materie
|b Materie
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914 1 _ |y 2004
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
915 _ _ |0 StatID:(DE-HGF)0020
|a No peer review
920 1 _ |k IFF-IEM
|l Elektronische Materialien
|d 31.12.2006
|g IFF
|0 I:(DE-Juel1)VDB321
|x 1
920 1 _ |k IFF-IMF
|l Mikrostrukturforschung
|d 31.12.2006
|g IFF
|0 I:(DE-Juel1)VDB37
|x 0
920 1 _ |k ZAT
|l Zentralabteilung Technologie
|g ZAT
|0 I:(DE-Juel1)ZAT-20090406
|x 2
920 1 _ |k ZEL
|l Zentralinstitut für Elektronik
|g ZEL
|0 I:(DE-Juel1)ZEL-20090406
|x 3
920 1 _ |k CNI
|l Center of Nanoelectronic Systems for Information Technology
|d 14.09.2008
|g CNI
|z 381
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