%0 Journal Article
%A Pertsev, N. A.
%A Rodriguez Contreras, J.
%A Kukhar, A. I.
%A Hermanns, B.
%A Kohlstedt, H.
%A Waser, R.
%T Coercive field of ultrathin PbZr0.52Ti0.48O3 epitaxial films
%J Applied physics letters
%V 83
%@ 0003-6951
%C Melville, NY
%I American Institute of Physics
%M PreJuSER-32036
%P 3356
%D 2003
%Z Record converted from VDB: 12.11.2012
%X The polarization reversal in single-crystalline ferroelectric films has been investigated experimentally and theoretically. The hysteresis loops were measured for Pb(Zr0.52Ti0.48)O-3 films with thicknesses ranging from 8 to 250 nm. These films were grown epitaxially on SrRuO3 bottom electrodes deposited on SrTiO3 substrates. The measurements using Pt top electrodes showed that the coercive field E-c increases drastically as the film becomes thinner, reaching values as high as E(c)approximate to1200 kV/cm. To understand this observation, we calculated the thermodynamic coercive field E-th of a ferroelectric film as a function of the misfit strain S-m in an epitaxial system and showed that E-th strongly depends on S-m. However, the coercive field of ultrathin films, when measured at high frequencies, exceeds the calculated thermodynamic limit. Since this is impossible for an intrinsic coercive field E-c, we conclude that measurements give an apparent E-c rather than the intrinsic one. An enormous increase of apparent coercive field in ultrathin films may be explained by the presence of a conductive nonferroelectric interface layer. (C) 2003 American Institute of Physics.
%K J (WoSType)
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000185954400042
%R 10.1063/1.1621731
%U https://juser.fz-juelich.de/record/32036