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000032036 0247_ $$2DOI$$a10.1063/1.1621731
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000032036 084__ $$2WoS$$aPhysics, Applied
000032036 1001_ $$0P:(DE-HGF)0$$aPertsev, N. A.$$b0
000032036 245__ $$aCoercive field of ultrathin PbZr0.52Ti0.48O3 epitaxial films
000032036 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2003
000032036 300__ $$a3356
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000032036 440_0 $$0562$$aApplied Physics Letters$$v83$$x0003-6951
000032036 500__ $$aRecord converted from VDB: 12.11.2012
000032036 520__ $$aThe polarization reversal in single-crystalline ferroelectric films has been investigated experimentally and theoretically. The hysteresis loops were measured for Pb(Zr0.52Ti0.48)O-3 films with thicknesses ranging from 8 to 250 nm. These films were grown epitaxially on SrRuO3 bottom electrodes deposited on SrTiO3 substrates. The measurements using Pt top electrodes showed that the coercive field E-c increases drastically as the film becomes thinner, reaching values as high as E(c)approximate to1200 kV/cm. To understand this observation, we calculated the thermodynamic coercive field E-th of a ferroelectric film as a function of the misfit strain S-m in an epitaxial system and showed that E-th strongly depends on S-m. However, the coercive field of ultrathin films, when measured at high frequencies, exceeds the calculated thermodynamic limit. Since this is impossible for an intrinsic coercive field E-c, we conclude that measurements give an apparent E-c rather than the intrinsic one. An enormous increase of apparent coercive field in ultrathin films may be explained by the presence of a conductive nonferroelectric interface layer. (C) 2003 American Institute of Physics.
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000032036 7001_ $$0P:(DE-Juel1)VDB5562$$aRodriguez Contreras, J.$$b1$$uFZJ
000032036 7001_ $$0P:(DE-HGF)0$$aKukhar, A. I.$$b2
000032036 7001_ $$0P:(DE-Juel1)VDB25956$$aHermanns, B.$$b3$$uFZJ
000032036 7001_ $$0P:(DE-Juel1)VDB3107$$aKohlstedt, H.$$b4$$uFZJ
000032036 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b5$$uFZJ
000032036 773__ $$0PERI:(DE-600)1469436-0$$a10.1063/1.1621731$$gVol. 83, p. 3356$$p3356$$q83<3356$$tApplied physics letters$$v83$$x0003-6951$$y2003
000032036 8567_ $$uhttp://hdl.handle.net/2128/1241$$uhttp://dx.doi.org/10.1063/1.1621731
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