TY  - JOUR
AU  - Pertsev, N. A.
AU  - Rodriguez Contreras, J.
AU  - Kukhar, A. I.
AU  - Hermanns, B.
AU  - Kohlstedt, H.
AU  - Waser, R.
TI  - Coercive field of ultrathin PbZr0.52Ti0.48O3 epitaxial films
JO  - Applied physics letters
VL  - 83
SN  - 0003-6951
CY  - Melville, NY
PB  - American Institute of Physics
M1  - PreJuSER-32036
SP  - 3356
PY  - 2003
N1  - Record converted from VDB: 12.11.2012
AB  - The polarization reversal in single-crystalline ferroelectric films has been investigated experimentally and theoretically. The hysteresis loops were measured for Pb(Zr0.52Ti0.48)O-3 films with thicknesses ranging from 8 to 250 nm. These films were grown epitaxially on SrRuO3 bottom electrodes deposited on SrTiO3 substrates. The measurements using Pt top electrodes showed that the coercive field E-c increases drastically as the film becomes thinner, reaching values as high as E(c)approximate to1200 kV/cm. To understand this observation, we calculated the thermodynamic coercive field E-th of a ferroelectric film as a function of the misfit strain S-m in an epitaxial system and showed that E-th strongly depends on S-m. However, the coercive field of ultrathin films, when measured at high frequencies, exceeds the calculated thermodynamic limit. Since this is impossible for an intrinsic coercive field E-c, we conclude that measurements give an apparent E-c rather than the intrinsic one. An enormous increase of apparent coercive field in ultrathin films may be explained by the presence of a conductive nonferroelectric interface layer. (C) 2003 American Institute of Physics.
KW  - J (WoSType)
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000185954400042
DO  - DOI:10.1063/1.1621731
UR  - https://juser.fz-juelich.de/record/32036
ER  -