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@ARTICLE{Das:32037,
      author       = {Das, J. and Degraeve, R. and Stein, S. and Kohlstedt, H.
                      and Groeseneken, C. J. and Borghs, G. and de Boeck, J.},
      title        = {{S}tatistical model for prebreakdown current jumps and
                      breakdown caused by single traps in magnetic tunnel
                      junctions},
      journal      = {Journal of applied physics},
      volume       = {94},
      issn         = {0021-8979},
      address      = {Melville, NY},
      publisher    = {American Institute of Physics},
      reportid     = {PreJuSER-32037},
      pages        = {2749 - 2751},
      year         = {2003},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {To obtain reliable magnetic tunnel junctions (MTJs) for
                      sensor and memory applications, the quality of the Al2O3
                      tunnel barrier is extremely important. Here, we studied the
                      reliability of MTJs with a 1.6 nm Al2O3 tunnel barrier
                      formed by ultraviolet light assisted oxidation. In the
                      stress measurements, prebreakdown current jumps and,
                      finally, breakdown are observed. We show, by using
                      statistics, that both the current jumps and the final
                      breakdown can be attributed to single trap generation.
                      Moreover, we can relate the current jump height to the trap
                      location. In this way, we reveal the breakdown mechanism in
                      MTJs and illustrate the importance of reliability studies.
                      (C) 2003 American Institute of Physics.},
      keywords     = {J (WoSType)},
      cin          = {IFF-EKM},
      ddc          = {530},
      cid          = {I:(DE-Juel1)VDB35},
      pnm          = {Materialien, Prozesse und Bauelemente für die Mikro- und
                      Nanoelektronik},
      pid          = {G:(DE-Juel1)FUEK252},
      shelfmark    = {Physics, Applied},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000184469800096},
      doi          = {10.1063/1.1592300},
      url          = {https://juser.fz-juelich.de/record/32037},
}