001     32207
005     20180210134731.0
024 7 _ |2 DOI
|a 10.1016/S0013-4686(02)00836-8
024 7 _ |2 WOS
|a WOS:000181814400018
037 _ _ |a PreJuSER-32207
041 _ _ |a eng
082 _ _ |a 540
084 _ _ |2 WoS
|a Electrochemistry
100 1 _ |a García, S. G.
|b 0
|0 P:(DE-HGF)0
245 _ _ |a STM Tip-Induced Local Electrochemical Dissolution of Silver
260 _ _ |a New York, NY [u.a.]
|b Elsevier
|c 2003
300 _ _ |a 1279 - 1285
336 7 _ |a Journal Article
|0 PUB:(DE-HGF)16
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336 7 _ |a ARTICLE
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336 7 _ |a JOURNAL_ARTICLE
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336 7 _ |a article
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440 _ 0 |a Electrochimica Acta
|x 0013-4686
|0 1776
|v 48
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a Local dissolution/deposition processes under in situ scanning tunneling microscopy (STM) imaging conditions are studied in the systems Ag(111)/Ag+, ClO4- and Ag(111)/Ag+, SO42-. The results show that in both systems the local kinetics of these processes strongly depend on the polarization conditions. At STM-tip potentials more positive than the Ag/Ag+ equilibrium potential, a local dissolution of the Ag(111) substrate is observed even at cathodic substrate overpotentials at which the overall substrate current density is cathodic. This tip-induced Ag dissolution is in agreement with results obtained recently in the system Cu((111))/Cu2+. The enhanced local Ag dissolution is explained by a reduced Ag+ concentration underneath the STM tip promoted by both an electrostatic repulsion of Ag+ and a reduction of the mass transport due to the shielding effect of the tip. The possibility for a preparation of negative Ag nanostructures by STM tip-induced electrochemical dissolution is demonstrated. (C) 2003 Elsevier Science Ltd. All rights reserved.
536 _ _ |a Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
|c I01
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588 _ _ |a Dataset connected to Web of Science
650 _ 7 |a J
|2 WoSType
653 2 0 |2 Author
|a silver
653 2 0 |2 Author
|a STM
653 2 0 |2 Author
|a tip-induced dissolution
653 2 0 |2 Author
|a local etching
653 2 0 |2 Author
|a nanostructuring
700 1 _ |a Salinas, D. R.
|b 1
|0 P:(DE-HGF)0
700 1 _ |a Mayer, C. E.
|b 2
|0 P:(DE-HGF)0
700 1 _ |a Lorenz, W. J.
|b 3
|0 P:(DE-HGF)0
700 1 _ |a Staikov, G.
|b 4
|u FZJ
|0 P:(DE-Juel1)VDB13645
773 _ _ |a 10.1016/S0013-4686(02)00836-8
|g Vol. 48, p. 1279 - 1285
|p 1279 - 1285
|q 48<1279 - 1285
|0 PERI:(DE-600)1483548-4
|t Electrochimica acta
|v 48
|y 2003
|x 0013-4686
856 7 _ |u http://dx.doi.org/10.1016/S0013-4686(02)00836-8
909 C O |o oai:juser.fz-juelich.de:32207
|p VDB
913 1 _ |k I01
|v Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
|l Informationstechnologie mit nanoelektronischen Systemen
|b Information
|0 G:(DE-Juel1)FUEK252
|x 0
914 1 _ |y 2003
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
920 1 _ |k ISG-3
|l Institut für Grenzflächen und Vakuumtechnologien
|d 31.12.2006
|g ISG
|0 I:(DE-Juel1)VDB43
|x 0
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980 _ _ |a UNRESTRICTED
981 _ _ |a I:(DE-Juel1)PGI-3-20110106


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