000003364 001__ 3364
000003364 005__ 20200423202447.0
000003364 0247_ $$2DOI$$a10.1063/1.3043879
000003364 0247_ $$2WOS$$aWOS:000262225100068
000003364 0247_ $$2Handle$$a2128/17233
000003364 0247_ $$2altmetric$$aaltmetric:21801365
000003364 037__ $$aPreJuSER-3364
000003364 041__ $$aeng
000003364 082__ $$a530
000003364 084__ $$2WoS$$aPhysics, Applied
000003364 1001_ $$0P:(DE-Juel1)VDB58644$$aJeong, D. S.$$b0$$uFZJ
000003364 245__ $$aCharacteristic electroforming behavior in Pt/TiO2/Pt resistive switching cells depending on atmosphere
000003364 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2008
000003364 300__ $$a123716
000003364 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article
000003364 3367_ $$2DataCite$$aOutput Types/Journal article
000003364 3367_ $$00$$2EndNote$$aJournal Article
000003364 3367_ $$2BibTeX$$aARTICLE
000003364 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000003364 3367_ $$2DRIVER$$aarticle
000003364 440_0 $$03051$$aJournal of Applied Physics$$v104$$x0021-8979
000003364 500__ $$aOne of the authors (D.S.J) would like to thank the Deutscher Akademischer Austausch Dienst for the scholarship supporting his research at the Forschunszentrym Julich GmbH. The authors thank K. Szot for the C-AFM measurements and fruitful discussions.
000003364 520__ $$aElectroforming effects on the composition, structure, and electrical resistance of Pt/TiO2/Pt switching cells are investigated. The correlation between the electroforming procedure and the resulting bipolar switching behavior is discussed. The dependence of electroforming behavior on atmosphere is also identified, from which we define symmetric or asymmetric electroforming. The symmetry of electroforming is a key factor determining the resulting bipolar switching characteristics. From the experimental results we suggest a possible mechanism for electroforming in Pt/TiO2/Pt in terms of the formation of oxygen gas and vacancies in the vicinity of the anode.
000003364 536__ $$0G:(DE-Juel1)FUEK412$$2G:(DE-HGF)$$aGrundlagen für zukünftige Informationstechnologien$$cP42$$x0
000003364 588__ $$aDataset connected to Web of Science
000003364 650_7 $$2WoSType$$aJ
000003364 65320 $$2Author$$aelectrical resistivity
000003364 65320 $$2Author$$aelectroforming
000003364 65320 $$2Author$$aMIM structures
000003364 65320 $$2Author$$aplatinum
000003364 65320 $$2Author$$atime of flight mass spectra
000003364 65320 $$2Author$$atitanium compounds
000003364 65320 $$2Author$$avacancies (crystal)
000003364 7001_ $$0P:(DE-Juel1)VDB3130$$aSchroeder, H.$$b1$$uFZJ
000003364 7001_ $$0P:(DE-Juel1)VDB2782$$aBreuer, U.$$b2$$uFZJ
000003364 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b3$$uFZJ
000003364 773__ $$0PERI:(DE-600)1476463-5$$a10.1063/1.3043879$$gVol. 104, p. 123716$$p123716$$q104<123716$$tJournal of applied physics$$v104$$x0021-8979$$y2008
000003364 8567_ $$uhttp://dx.doi.org/10.1063/1.3043879
000003364 8564_ $$uhttps://juser.fz-juelich.de/record/3364/files/1.3043879.pdf$$yOpenAccess
000003364 8564_ $$uhttps://juser.fz-juelich.de/record/3364/files/1.3043879.gif?subformat=icon$$xicon$$yOpenAccess
000003364 8564_ $$uhttps://juser.fz-juelich.de/record/3364/files/1.3043879.jpg?subformat=icon-180$$xicon-180$$yOpenAccess
000003364 8564_ $$uhttps://juser.fz-juelich.de/record/3364/files/1.3043879.jpg?subformat=icon-700$$xicon-700$$yOpenAccess
000003364 8564_ $$uhttps://juser.fz-juelich.de/record/3364/files/1.3043879.pdf?subformat=pdfa$$xpdfa$$yOpenAccess
000003364 909CO $$ooai:juser.fz-juelich.de:3364$$pdnbdelivery$$pdriver$$pVDB$$popen_access$$popenaire
000003364 9131_ $$0G:(DE-Juel1)FUEK412$$bSchlüsseltechnologien$$kP42$$lGrundlagen für zukünftige Informationstechnologien (FIT)$$vGrundlagen für zukünftige Informationstechnologien$$x0
000003364 9141_ $$y2008
000003364 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000003364 915__ $$0StatID:(DE-HGF)0010$$aJCR/ISI refereed
000003364 9201_ $$0I:(DE-Juel1)VDB786$$d31.12.2010$$gIFF$$kIFF-6$$lElektronische Materialien$$x0
000003364 9201_ $$0I:(DE-82)080009_20140620$$gJARA$$kJARA-FIT$$lJülich-Aachen Research Alliance - Fundamentals of Future Information Technology$$x1
000003364 9201_ $$0I:(DE-Juel1)ZCH-20090406$$gZCH$$kZCH$$lZentralabteilung für Chemische Analysen$$x2
000003364 970__ $$aVDB:(DE-Juel1)109340
000003364 980__ $$aVDB
000003364 980__ $$aConvertedRecord
000003364 980__ $$ajournal
000003364 980__ $$aI:(DE-Juel1)PGI-7-20110106
000003364 980__ $$aI:(DE-82)080009_20140620
000003364 980__ $$aI:(DE-Juel1)ZEA-3-20090406
000003364 980__ $$aUNRESTRICTED
000003364 9801_ $$aFullTexts
000003364 981__ $$aI:(DE-Juel1)PGI-7-20110106
000003364 981__ $$aI:(DE-Juel1)ZEA-3-20090406
000003364 981__ $$aI:(DE-Juel1)VDB881