TY  - THES
AU  - Thönissen, M.
TI  - Spektroskopische Charakterisierung von Schichten und Schichtsystemen aus porösem Silicium im Hinblick auf optische und optoelektronische Anwendungen
VL  - 3628
IS  - Juel-3628
SN  - 0944-2952
PB  - Techn. Hochsch. Aachen
VL  - Dr. (FH)
CY  - Jülich
M1  - PreJuSER-36405
M1  - Juel-3628
T2  - Berichte des Forschungszentrums Jülich
PY  - 1999
N1  - Record converted from JUWEL: 18.07.2013
N1  - Aachen, Techn. Hochsch., Diss., 1999
AB  - Investigations were made on both, single layers and layer systems of porous silicon, using optical spectroscopy, gravimetry, diffractrometry and topographic methods, and REM and TEM aswell. Main emphasis of the investigations was concentrated to the optimization of single layers and layer systems with a view to application and basic studies, aiming at an industrial applicability in optical and opto-electronic components. The results of the investigations presented here show new ways of applications by using porous silicon, e.g., electrically controllable filter structures on the basis of liquid crystals, diffraction gratings of porous silicon and spectral sensitive photodiodes.
LB  - PUB:(DE-HGF)11 ; PUB:(DE-HGF)3
UR  - https://juser.fz-juelich.de/record/36405
ER  -