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Fabrication of nanometer Schottky-tunnel MOSFETs by a novel silicide nanopatterning method
Zhao, Q. T. ; Kappius, L.FZJ* ; Mesters, S. ; Mantl, S.FZJ*
1999
1999SPIE-Conference on In-line Methods Monitors for Process and Yield Improvement, which occured at the SPIE Microelectronic MAnufacturing Symposium : Santa Clara, CA, 22.-23.9.1999 / ed.: S. Ajuria ... - Bellingham, Wash., 1999. - (SPIE proceedings series ; 3884). - 0-8194-3481-7
Note: Record converted from VDB: 12.11.2012
Contributing Institute(s):
- Institut für Schicht- und Ionentechnik (ISI)
Research Program(s):
- Ionentechnik (29.87.0)
Appears in the scientific report
1999
Notes: Proceedings