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000039976 084__ $$2WoS$$aPhysics, Applied
000039976 1001_ $$0P:(DE-Juel1)VDB5491$$aHeinsohn, J.-K.$$b0$$uFZJ
000039976 245__ $$aEffect of the magnetic field orientation on the modulation period of the critical current of ramp-type Josephson junctions
000039976 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2001
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000039976 520__ $$aWe have investigated the dependence of the critical current I-C on the value and orientation of an externally applied magnetic field H for interface-engineered YBa2Cu3O7-x ramp-type Josephson junctions. The results are compared with measurements of Nb ramp-type junctions with a PdAu interlayer. The I-C versus H dependences are similar to Fraunhofer patterns and their modulation period changes several orders of magnitude with the orientation of the magnetic field. For both junction types, the dependence of the modulation period on the orientation of the magnetic field can be well described by the change of the relevant projection of the junction area and the influence of flux-focusing. Therefore the features of the I-C(H) curves have to be attributed to the ramp geometry and not to specific properties of the superconducting material. (C) 2001 American Institute of Physics.
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000039976 7001_ $$0P:(DE-Juel1)VDB5464$$aDittmann, R.$$b1$$uFZJ
000039976 7001_ $$0P:(DE-Juel1)VDB5562$$aRodriguez Contreras, J.$$b2$$uFZJ
000039976 7001_ $$0P:(DE-Juel1)VDB3106$$aGoldobin, E.$$b3$$uFZJ
000039976 7001_ $$0P:(DE-Juel1)VDB5527$$aKlushin, A. M.$$b4$$uFZJ
000039976 7001_ $$0P:(DE-Juel1)VDB3105$$aSiegel, M.$$b5$$uFZJ
000039976 7001_ $$0P:(DE-HGF)0$$aHagedorn, D.$$b6
000039976 7001_ $$0P:(DE-HGF)0$$aPöpel, R.$$b7
000039976 7001_ $$0P:(DE-HGF)0$$aDolata, R.$$b8
000039976 7001_ $$0P:(DE-HGF)0$$aBuchholz, F.-I.$$b9
000039976 7001_ $$0P:(DE-HGF)0$$aNiemeyer, J.$$b10
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