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@ARTICLE{Heinsohn:39976,
      author       = {Heinsohn, J.-K. and Dittmann, R. and Rodriguez Contreras,
                      J. and Goldobin, E. and Klushin, A. M. and Siegel, M. and
                      Hagedorn, D. and Pöpel, R. and Dolata, R. and Buchholz,
                      F.-I. and Niemeyer, J.},
      title        = {{E}ffect of the magnetic field orientation on the
                      modulation period of the critical current of ramp-type
                      {J}osephson junctions},
      journal      = {Journal of applied physics},
      volume       = {90},
      issn         = {0021-8979},
      address      = {Melville, NY},
      publisher    = {American Institute of Physics},
      reportid     = {PreJuSER-39976},
      pages        = {4623},
      year         = {2001},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {We have investigated the dependence of the critical current
                      I-C on the value and orientation of an externally applied
                      magnetic field H for interface-engineered YBa2Cu3O7-x
                      ramp-type Josephson junctions. The results are compared with
                      measurements of Nb ramp-type junctions with a PdAu
                      interlayer. The I-C versus H dependences are similar to
                      Fraunhofer patterns and their modulation period changes
                      several orders of magnitude with the orientation of the
                      magnetic field. For both junction types, the dependence of
                      the modulation period on the orientation of the magnetic
                      field can be well described by the change of the relevant
                      projection of the junction area and the influence of
                      flux-focusing. Therefore the features of the I-C(H) curves
                      have to be attributed to the ramp geometry and not to
                      specific properties of the superconducting material. (C)
                      2001 American Institute of Physics.},
      keywords     = {J (WoSType)},
      cin          = {ISG-2 / IFF-EKM},
      ddc          = {530},
      cid          = {I:(DE-Juel1)VDB42 / I:(DE-Juel1)VDB35},
      pnm          = {Schichtsysteme und Bauelemente der Supraleiterelektronik},
      pid          = {G:(DE-Juel1)FUEK65},
      shelfmark    = {Physics, Applied},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000171594800045},
      doi          = {10.1063/1.1406969},
      url          = {https://juser.fz-juelich.de/record/39976},
}