001     40328
005     20180210141607.0
024 7 _ |2 DOI
|a 10.1016/S0039-6028(01)00977-3
024 7 _ |2 WOS
|a WOS:000168926100019
037 _ _ |a PreJuSER-40328
041 _ _ |a eng
082 _ _ |a 540
084 _ _ |2 WoS
|a Chemistry, Physical
084 _ _ |2 WoS
|a Physics, Condensed Matter
100 1 _ |a Pan, F. M.
|0 P:(DE-Juel1)VDB5555
|b 0
|u FZJ
245 _ _ |a Formation of an ordered oxide on the CoGa(100) surface by room temperature oxidation and annealing
260 _ _ |a Amsterdam
|b Elsevier
|c 2001
300 _ _ |a 191
336 7 _ |a Journal Article
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336 7 _ |a Journal Article
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336 7 _ |a ARTICLE
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336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a article
|2 DRIVER
440 _ 0 |a Surface Science
|x 0039-6028
|0 5673
|v 479
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a The preparation of an ordered GaO3 oxide on the GoGa(1 0 0) surface by exposing the surface to oxygen at room temperature and subsequent annealing has been studied by thermal energy helium atom scattering and Auger electron spectroscopy. During room temperature oxidation a disordered Ga2O3 layer forms. The oxidation process is studied with lie scattering and the results are compared with previously reported scanning tunneling microscopy investigations. Upon annealing, it is found that ordering of the oxide layer proceeds very slowly. Even at a temperature of 800 K, 50 K below the temperature at which the oxide decomposes and disappears from the surface, the ordering process is not yet completed after 1000 s. It is concluded that a smooth oxide film can be prepared by room temperature exposure to oxygen and annealing at temperatures just below decomposition temperature of the oxide (850 K) which is very uniform with respect to thickness. However, the amount of oxygen adsorbing at 300 K is not sufficient to produce a continuous film. About 10-15% of the surface is not covered by the oxide after this preparation method. To prepare a continuous oxide layer several cycles of room temperature oxidation and annealing seem necessary. (C) 2001 Elsevier Science B.V. All rights reserved.
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650 _ 7 |a J
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653 2 0 |2 Author
|a atom solid scattering and diffraction-inelastic
653 2 0 |2 Author
|a oxidation
653 2 0 |2 Author
|a surface structure, morphology, roughness, and topography
653 2 0 |2 Author
|a cobalt
653 2 0 |2 Author
|a gallium
653 2 0 |2 Author
|a low index single crystal surfaces
700 1 _ |a Pflitsch, C.
|0 P:(DE-Juel1)VDB5560
|b 1
|u FZJ
700 1 _ |a David, R.
|0 P:(DE-Juel1)VDB5790
|b 2
|u FZJ
700 1 _ |a Verheij, L. K.
|0 P:(DE-Juel1)VDB5574
|b 3
|u FZJ
700 1 _ |a Franchy, R.
|0 P:(DE-Juel1)VDB5400
|b 4
|u FZJ
773 _ _ |a 10.1016/S0039-6028(01)00977-3
|g Vol. 479, p. 191
|p 191
|q 479<191
|0 PERI:(DE-600)1479030-0
|t Surface science
|v 479
|y 2001
|x 0039-6028
909 C O |o oai:juser.fz-juelich.de:40328
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913 1 _ |k 29.35.0
|v Grenzflächenaspekte der Informationstechnik
|l Grundlagenforschung zur Informationstechnik
|b Informationstechnik
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|x 0
914 1 _ |y 2001
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
920 1 _ |k ISG-3
|l Institut für Grenzflächen und Vakuumtechnologien
|d 31.12.2006
|g ISG
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980 _ _ |a UNRESTRICTED
981 _ _ |a I:(DE-Juel1)PGI-3-20110106


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