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000040847 084__ $$2WoS$$aMaterials Science, Ceramics
000040847 1001_ $$0P:(DE-Juel1)VDB22118$$aElsebrock, R.$$b0$$uFZJ
000040847 245__ $$aPreparation and characterization of high density, high purity lanthanum aluminate bulk ceramics
000040847 260__ $$aDordrecht [u.a.]$$bSpringer Science + Business Media B.V$$c2003
000040847 300__ $$a193 - 202
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000040847 440_0 $$03263$$aJournal of Electroceramics$$v10$$x1385-3449
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000040847 520__ $$aIn this work some methods for preparation of lanthanum aluminate bulk ceramics were compared. High purity lanthanum aluminate LaAlO3 (LAO) ceramic samples of high density (>94%) were prepared via three different routes and the morphology, chemical and electrical properties of the samples were investigated. For high purity samples a sol-gel route A. Douy and P. Odier [1] and a thermal nitrate decomposition route Shaji Kumar et al. [2] were introduced to reduce unintentional doping by the preparation process to a minimum. As a standard route the mixed oxide process was chosen. In sol-gel and nitrate decomposition procedures the formation temperature of LaAlO3 from its oxides was lowered by using reactive gamma-alumina from the pyrolysis of initial aluminium nitrate instead of commonly used alpha-alumina (corundum) in the mixed oxide process. No commercial gamma-alumina of sufficient purity is known.Differences in the electrical behaviour of the samples were measured, indicating some correlations between the samples' different morphology, purity and its' preparation parameters.
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000040847 65320 $$2Author$$alanthanum aluminate
000040847 65320 $$2Author$$aceramics preparation
000040847 65320 $$2Author$$aelectrical properties
000040847 7001_ $$0P:(DE-Juel1)VDB22120$$aMakovicka, C.$$b1$$uFZJ
000040847 7001_ $$0P:(DE-Juel1)130836$$aMeuffels, P.$$b2$$uFZJ
000040847 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b3$$uFZJ
000040847 773__ $$0PERI:(DE-600)1472395-5$$a10.1023/B:JECR.0000011217.93927.1a$$gVol. 10, p. 193 - 202$$p193 - 202$$q10<193 - 202$$tJournal of electroceramics$$v10$$x1385-3449$$y2003
000040847 8567_ $$uhttp://dx.doi.org/10.1023/B:JECR.0000011217.93927.1a
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000040847 9141_ $$aNachtrag$$y2003
000040847 915__ $$0StatID:(DE-HGF)0010$$aJCR/ISI refereed
000040847 9201_ $$0I:(DE-Juel1)VDB321$$d31.12.2006$$gIFF$$kIFF-IEM$$lElektronische Materialien$$x0
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