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001     41462
005     20200423203919.0
017 _ _ |a This version is available at the following Publisher URL: http://apl.aip.org
024 7 _ |a 10.1063/1.1765742
|2 DOI
024 7 _ |a WOS:000222111800053
|2 WOS
024 7 _ |a 2128/995
|2 Handle
024 7 _ |a altmetric:5609704
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037 _ _ |a PreJuSER-41462
041 _ _ |a eng
082 _ _ |a 530
084 _ _ |2 WoS
|a Physics, Applied
100 1 _ |a Nagarajan, V.
|b 0
|u FZJ
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245 _ _ |a Size effects in ultrathin epitaxial ferroelectric heterostructures
260 _ _ |a Melville, NY
|b American Institute of Physics
|c 2004
300 _ _ |a
336 7 _ |a Journal Article
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336 7 _ |a Journal Article
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336 7 _ |a JOURNAL_ARTICLE
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336 7 _ |a article
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440 _ 0 |a Applied Physics Letters
|x 0003-6951
|0 562
|y 5225
|v 84
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a In this letter we report on the effect of thickness scaling in model PbZr0.2Ti0.8O3(PZT)/SrRuO3 heterostructures. Although theoretical models for thickness scaling have been widely reported, direct quantitative experimental data for ultrathin perovskite (<10 nm) films in the presence of real electrodes have still not been reported. In this letter we show a systematic quantitative experimental study of the thickness dependence of switched polarization in (001) epitaxial PZT films, 4 to 80 nm thick. A preliminary model based on a modified Landau Ginzburg approach suggests that the nature of the electrostatics at the ferroelectric-electrode interface plays a significant role in the scaling of ferroelectric thin films. (C) 2004 American Institute of Physics.
536 _ _ |a Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
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700 1 _ |a Prasertchoung, S.
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700 1 _ |a Zhao, T.
|b 2
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700 1 _ |a Zheng, H.
|b 3
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700 1 _ |a Ouyang, J.
|b 4
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700 1 _ |a Ramesh, R.
|b 5
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700 1 _ |a Tian, W.
|b 6
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700 1 _ |a Pan, X. Q.
|b 7
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700 1 _ |a Kim, D. M.
|b 8
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700 1 _ |a Eom, C. B.
|b 9
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700 1 _ |a Kohlstedt, H.
|b 10
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700 1 _ |a Waser, R.
|b 11
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773 _ _ |a 10.1063/1.1765742
|g Vol. 84
|q 84
|0 PERI:(DE-600)1469436-0
|t Applied physics letters
|v 84
|y 2004
|x 0003-6951
856 7 _ |u http://dx.doi.org/10.1063/1.1765742
|u http://hdl.handle.net/2128/995
856 4 _ |u https://juser.fz-juelich.de/record/41462/files/57233.pdf
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