%0 Journal Article
%A Peter, F.
%A Rüdiger, A.
%A Waser, R.
%A Szot, K.
%A Reichenberg, B.
%T Comparison of in-plane and out-of-plane optical amplification in AFM measurements
%J Review of scientific instruments
%V 76
%@ 0034-6748
%C [S.l.]
%I American Institute of Physics
%M PreJuSER-45392
%P 046101
%D 2005
%Z Record converted from VDB: 12.11.2012
%X The in-plane image of piezoresponse force microscopy (PFM) generally exhibits a higher resolution and less noise than the out-of-plane image. Geometrical considerations indicate that the optical in-plane amplification is approximate to 40 times larger than the out-of-plane amplification. We experimentally confirm this explanation in a dedicated setup. (C) American Institute of Physics.
%K J (WoSType)
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000228362200049
%R 10.1063/1.1878153
%U https://juser.fz-juelich.de/record/45392