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000045392 084__ $$2WoS$$aInstruments & Instrumentation
000045392 084__ $$2WoS$$aPhysics, Applied
000045392 1001_ $$0P:(DE-Juel1)VDB42216$$aPeter, F.$$b0$$uFZJ
000045392 245__ $$aComparison of in-plane and out-of-plane optical amplification in AFM measurements
000045392 260__ $$a[S.l.]$$bAmerican Institute of Physics$$c2005
000045392 300__ $$a046101
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000045392 520__ $$aThe in-plane image of piezoresponse force microscopy (PFM) generally exhibits a higher resolution and less noise than the out-of-plane image. Geometrical considerations indicate that the optical in-plane amplification is approximate to 40 times larger than the out-of-plane amplification. We experimentally confirm this explanation in a dedicated setup. (C) American Institute of Physics.
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000045392 7001_ $$0P:(DE-Juel1)VDB26957$$aRüdiger, A.$$b1$$uFZJ
000045392 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b2$$uFZJ
000045392 7001_ $$0P:(DE-Juel1)VDB2799$$aSzot, K.$$b3$$uFZJ
000045392 7001_ $$0P:(DE-HGF)0$$aReichenberg, B.$$b4
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