TY  - JOUR
AU  - Peter, F.
AU  - Rüdiger, A.
AU  - Waser, R.
AU  - Szot, K.
AU  - Reichenberg, B.
TI  - Comparison of in-plane and out-of-plane optical amplification in AFM measurements
JO  - Review of scientific instruments
VL  - 76
SN  - 0034-6748
CY  - [S.l.]
PB  - American Institute of Physics
M1  - PreJuSER-45392
SP  - 046101
PY  - 2005
N1  - Record converted from VDB: 12.11.2012
AB  - The in-plane image of piezoresponse force microscopy (PFM) generally exhibits a higher resolution and less noise than the out-of-plane image. Geometrical considerations indicate that the optical in-plane amplification is approximate to 40 times larger than the out-of-plane amplification. We experimentally confirm this explanation in a dedicated setup. (C) American Institute of Physics.
KW  - J (WoSType)
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000228362200049
DO  - DOI:10.1063/1.1878153
UR  - https://juser.fz-juelich.de/record/45392
ER  -