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@ARTICLE{Peter:45392,
      author       = {Peter, F. and Rüdiger, A. and Waser, R. and Szot, K. and
                      Reichenberg, B.},
      title        = {{C}omparison of in-plane and out-of-plane optical
                      amplification in {AFM} measurements},
      journal      = {Review of scientific instruments},
      volume       = {76},
      issn         = {0034-6748},
      address      = {[S.l.]},
      publisher    = {American Institute of Physics},
      reportid     = {PreJuSER-45392},
      pages        = {046101},
      year         = {2005},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {The in-plane image of piezoresponse force microscopy (PFM)
                      generally exhibits a higher resolution and less noise than
                      the out-of-plane image. Geometrical considerations indicate
                      that the optical in-plane amplification is approximate to 40
                      times larger than the out-of-plane amplification. We
                      experimentally confirm this explanation in a dedicated
                      setup. (C) American Institute of Physics.},
      keywords     = {J (WoSType)},
      cin          = {IFF-IEM / CNI},
      ddc          = {530},
      cid          = {I:(DE-Juel1)VDB321 / I:(DE-Juel1)VDB381},
      pnm          = {Materialien, Prozesse und Bauelemente für die Mikro- und
                      Nanoelektronik},
      pid          = {G:(DE-Juel1)FUEK252},
      shelfmark    = {Instruments $\&$ Instrumentation / Physics, Applied},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000228362200049},
      doi          = {10.1063/1.1878153},
      url          = {https://juser.fz-juelich.de/record/45392},
}