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000045695 084__ $$2WoS$$aPhysics, Multidisciplinary
000045695 1001_ $$0P:(DE-Juel1)VDB41360$$aLinke, F.$$b0$$uFZJ
000045695 245__ $$aQuantitative ellipsometric microscopy at the glass-water interface
000045695 260__ $$a[Bad Honnef]$$bDt. Physikalische Ges.$$c2005
000045695 300__ $$a128
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000045695 520__ $$aEllipsometric microscopy is a technique for simultaneous measurement of thin film thickness and index of refraction at a lateral resolution of approximately 1 mm. Up to now this technique has been used on silicon-air interfaces. However, biological processes take place often in aqueous solution and are studied at the glass-water interface. Due to the very low reflectivity of this interface we had to improve ellipsometric microscopy substantially. Here we present our approach to suppress the intensity of internal stray light by several orders of magnitude and show quantitative and laterally resolved ellipsometric measurements at the glass-water interface. When instrumental polarization was taken into account, an accuracy of dy = 0.41. and dD = 4.3 was achieved.
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000045695 7001_ $$0P:(DE-Juel1)128833$$aMerkel, R.$$b1$$uFZJ
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000045695 8567_ $$uhttp://hdl.handle.net/2128/2178$$uhttp://dx.doi.org/10.1088/1367-2630/7/1/128
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