TY  - JOUR
AU  - Linke, F.
AU  - Merkel, R.
TI  - Quantitative ellipsometric microscopy at the glass-water interface
JO  - New journal of physics
VL  - 7
SN  - 1367-2630
CY  - [Bad Honnef]
PB  - Dt. Physikalische Ges.
M1  - PreJuSER-45695
SP  - 128
PY  - 2005
N1  - Record converted from VDB: 12.11.2012
AB  - Ellipsometric microscopy is a technique for simultaneous measurement of thin film thickness and index of refraction at a lateral resolution of approximately 1 mm. Up to now this technique has been used on silicon-air interfaces. However, biological processes take place often in aqueous solution and are studied at the glass-water interface. Due to the very low reflectivity of this interface we had to improve ellipsometric microscopy substantially. Here we present our approach to suppress the intensity of internal stray light by several orders of magnitude and show quantitative and laterally resolved ellipsometric measurements at the glass-water interface. When instrumental polarization was taken into account, an accuracy of dy = 0.41. and dD = 4.3 was achieved.
KW  - J (WoSType)
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000229241300001
DO  - DOI:10.1088/1367-2630/7/1/128
UR  - https://juser.fz-juelich.de/record/45695
ER  -