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@ARTICLE{Linke:45695,
author = {Linke, F. and Merkel, R.},
title = {{Q}uantitative ellipsometric microscopy at the glass-water
interface},
journal = {New journal of physics},
volume = {7},
issn = {1367-2630},
address = {[Bad Honnef]},
publisher = {Dt. Physikalische Ges.},
reportid = {PreJuSER-45695},
pages = {128},
year = {2005},
note = {Record converted from VDB: 12.11.2012},
abstract = {Ellipsometric microscopy is a technique for simultaneous
measurement of thin film thickness and index of refraction
at a lateral resolution of approximately 1 mm. Up to now
this technique has been used on silicon-air interfaces.
However, biological processes take place often in aqueous
solution and are studied at the glass-water interface. Due
to the very low reflectivity of this interface we had to
improve ellipsometric microscopy substantially. Here we
present our approach to suppress the intensity of internal
stray light by several orders of magnitude and show
quantitative and laterally resolved ellipsometric
measurements at the glass-water interface. When instrumental
polarization was taken into account, an accuracy of dy =
0.41. and dD = 4.3 was achieved.},
keywords = {J (WoSType)},
cin = {ISG-4},
ddc = {530},
cid = {I:(DE-Juel1)VDB44},
pnm = {Kondensierte Materie},
pid = {G:(DE-Juel1)FUEK242},
shelfmark = {Physics, Multidisciplinary},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000229241300001},
doi = {10.1088/1367-2630/7/1/128},
url = {https://juser.fz-juelich.de/record/45695},
}