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@ARTICLE{Slebarski:46658,
      author       = {Slebarski, E. C. and Szot, K. and Gamza, M. and Penkalla,
                      H.-J. and Breuer, U.},
      title        = {{I}nfluence of grain-boundary defects on electric transport
                      in {C}e{R}h{S}n with a non-{F}ermi-liquid ground state},
      journal      = {Physical review / B},
      volume       = {72},
      number       = {8},
      issn         = {1098-0121},
      address      = {College Park, Md.},
      publisher    = {APS},
      reportid     = {PreJuSER-46658},
      pages        = {085443},
      year         = {2005},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {Measurements by atomic force microscopy reported for a
                      polycrystalline CeRhSn sample show nanometer-sized grains
                      consisting of crystalline components. The grains are
                      separated by a grain boundary. The high-resolution electron
                      microscopy and secondary-ion mass spectrometry were used to
                      determine homogeneity of the grains and the grain boundary.
                      The grains are homogeneous up to about $60\%$ of the major
                      phase, with slightly off-stoichiometric phases constituting
                      the balance, whereas the volume fractions of
                      intercrystalline components are strongly inhomogeneous and
                      off stoichiometric. We argue that there is possibly a
                      ballistic transport of electrons through an interface
                      between the grains, which strongly modifies the resistivity
                      of the CeRhSn stoichiometric grains, which is
                      non-Fermi-liquid in character.},
      keywords     = {J (WoSType)},
      cin          = {ZCH / IFF-IEM / IWV-2},
      ddc          = {530},
      cid          = {I:(DE-Juel1)ZCH-20090406 / I:(DE-Juel1)VDB321 /
                      I:(DE-Juel1)VDB2},
      pnm          = {Materialien, Prozesse und Bauelemente für die Mikro- und
                      Nanoelektronik},
      pid          = {G:(DE-Juel1)FUEK252},
      shelfmark    = {Physics, Condensed Matter},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000231564600170},
      doi          = {10.1103/PhysRevB.72.085443},
      url          = {https://juser.fz-juelich.de/record/46658},
}