Home > Publications database > Influence of grain-boundary defects on electric transport in CeRhSn with a non-Fermi-liquid ground state > print

001     46658
005     20240711092259.0
017 _ _ |a This version is available at the following Publisher URL: http://publish.aps.org
024 7 _ |a 10.1103/PhysRevB.72.085443
|2 DOI
024 7 _ |a WOS:000231564600170
|2 WOS
024 7 _ |a 2128/2189
|2 Handle
037 _ _ |a PreJuSER-46658
041 _ _ |a eng
082 _ _ |a 530
084 _ _ |2 WoS
|a Physics, Condensed Matter
100 1 _ |a Slebarski, E. C.
|b 0
|0 P:(DE-HGF)0
245 _ _ |a Influence of grain-boundary defects on electric transport in CeRhSn with a non-Fermi-liquid ground state
260 _ _ |a College Park, Md.
|b APS
|c 2005
300 _ _ |a 085443-1 - 085443-6
336 7 _ |a Journal Article
|0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|0 0
|2 EndNote
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a article
|2 DRIVER
440 _ 0 |a Physical Review B
|x 1098-0121
|0 4919
|y 8
|v 72
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a Measurements by atomic force microscopy reported for a polycrystalline CeRhSn sample show nanometer-sized grains consisting of crystalline components. The grains are separated by a grain boundary. The high-resolution electron microscopy and secondary-ion mass spectrometry were used to determine homogeneity of the grains and the grain boundary. The grains are homogeneous up to about 60% of the major phase, with slightly off-stoichiometric phases constituting the balance, whereas the volume fractions of intercrystalline components are strongly inhomogeneous and off stoichiometric. We argue that there is possibly a ballistic transport of electrons through an interface between the grains, which strongly modifies the resistivity of the CeRhSn stoichiometric grains, which is non-Fermi-liquid in character.
536 _ _ |a Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
|c I01
|2 G:(DE-HGF)
|0 G:(DE-Juel1)FUEK252
|x 0
542 _ _ |i 2005-08-18
|2 Crossref
|u http://link.aps.org/licenses/aps-default-license
588 _ _ |a Dataset connected to Web of Science
650 _ 7 |a J
|2 WoSType
700 1 _ |a Szot, K.
|b 1
|u FZJ
|0 P:(DE-Juel1)VDB2799
700 1 _ |a Gamza, M.
|b 2
|0 P:(DE-HGF)0
700 1 _ |a Penkalla, H.-J.
|b 3
|u FZJ
|0 P:(DE-Juel1)VDB85249
700 1 _ |a Breuer, U.
|b 4
|u FZJ
|0 P:(DE-Juel1)VDB2782
773 1 8 |a 10.1103/physrevb.72.085443
|b American Physical Society (APS)
|d 2005-08-18
|n 8
|p 085443
|3 journal-article
|2 Crossref
|t Physical Review B
|v 72
|y 2005
|x 1098-0121
773 _ _ |a 10.1103/PhysRevB.72.085443
|g Vol. 72, p. 085443-1 - 085443-6
|p 085443
|n 8
|q 72<085443-1 - 085443-6
|0 PERI:(DE-600)2844160-6
|t Physical review / B
|v 72
|y 2005
|x 1098-0121
856 7 _ |u http://dx.doi.org/10.1103/PhysRevB.72.085443
|u http://hdl.handle.net/2128/2189
856 4 _ |u https://juser.fz-juelich.de/record/46658/files/73809.pdf
|y OpenAccess
856 4 _ |u https://juser.fz-juelich.de/record/46658/files/73809.jpg?subformat=icon-1440
|x icon-1440
|y OpenAccess
856 4 _ |u https://juser.fz-juelich.de/record/46658/files/73809.jpg?subformat=icon-180
|x icon-180
|y OpenAccess
856 4 _ |u https://juser.fz-juelich.de/record/46658/files/73809.jpg?subformat=icon-640
|x icon-640
|y OpenAccess
909 C O |o oai:juser.fz-juelich.de:46658
|p openaire
|p open_access
|p driver
|p VDB
|p dnbdelivery
913 1 _ |k I01
|v Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
|l Informationstechnologie mit nanoelektronischen Systemen
|b Information
|0 G:(DE-Juel1)FUEK252
|x 0
914 1 _ |y 2005
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
915 _ _ |2 StatID
|0 StatID:(DE-HGF)0510
|a OpenAccess
920 1 _ |k ZCH
|l Zentralabteilung für Chemische Analysen
|g ZCH
|0 I:(DE-Juel1)ZCH-20090406
|x 0
920 1 _ |k IFF-IEM
|l Elektronische Materialien
|d 31.12.2006
|g IFF
|0 I:(DE-Juel1)VDB321
|x 1
920 1 _ |k IWV-2
|l Werkstoffstruktur und Eigenschaften
|d 31.12.2006
|g IWV
|0 I:(DE-Juel1)VDB2
|x 2
970 _ _ |a VDB:(DE-Juel1)73809
980 1 _ |a FullTexts
980 _ _ |a VDB
980 _ _ |a JUWEL
980 _ _ |a ConvertedRecord
980 _ _ |a journal
980 _ _ |a I:(DE-Juel1)ZEA-3-20090406
980 _ _ |a I:(DE-Juel1)PGI-7-20110106
980 _ _ |a I:(DE-Juel1)IEK-2-20101013
980 _ _ |a UNRESTRICTED
980 _ _ |a FullTexts
981 _ _ |a I:(DE-Juel1)IMD-1-20101013
981 _ _ |a I:(DE-Juel1)ZEA-3-20090406
981 _ _ |a I:(DE-Juel1)PGI-7-20110106
981 _ _ |a I:(DE-Juel1)IEK-2-20101013
981 _ _ |a I:(DE-Juel1)ZCH-20090406
999 C 5 |1 A. Ślebarski
|y 2001
|2 Crossref
|o A. Ślebarski 2001
999 C 5 |a 10.1080/713838203
|9 -- missing cx lookup --
|1 A. Ślebarski
|p 943 -
|2 Crossref
|t Philos. Mag. B
|v 82
|y 2002
999 C 5 |a 10.1103/PhysRevB.48.7183
|9 -- missing cx lookup --
|2 Crossref
999 C 5 |a 10.1143/JPSJ.64.960
|9 -- missing cx lookup --
|2 Crossref
999 C 5 |a 10.1103/PhysRevLett.75.2023
|9 -- missing cx lookup --
|2 Crossref
999 C 5 |a 10.1088/0953-8984/8/48/014
|9 -- missing cx lookup --
|2 Crossref
999 C 5 |a 10.1103/PhysRevLett.81.3531
|9 -- missing cx lookup --
|2 Crossref
999 C 5 |a 10.1080/14786430410001678145
|9 -- missing cx lookup --
|2 Crossref
999 C 5 |a 10.1103/PhysRevLett.23.17
|9 -- missing cx lookup --
|2 Crossref
999 C 5 |a 10.1103/PhysRevB.66.104434
|9 -- missing cx lookup --
|2 Crossref
999 C 5 |a 10.1016/j.jmmm.2003.12.550
|9 -- missing cx lookup --
|1 A. Ślebarski
|p 234 -
|2 Crossref
|t J. Magn. Magn. Mater.
|v 272-276
|y 2004
999 C 5 |a 10.1103/PhysRevLett.53.2571
|9 -- missing cx lookup --
|2 Crossref
999 C 5 |1 O. K. Andersen
|y 1987
|2 Crossref
|t Electronic Structure and Its Applications
|o O. K. Andersen Electronic Structure and Its Applications 1987
999 C 5 |a 10.1088/0022-3719/5/13/012
|9 -- missing cx lookup --
|2 Crossref
999 C 5 |a 10.1088/0031-8949/32/4/024
|9 -- missing cx lookup --
|2 Crossref
999 C 5 |a 10.1016/0092-640X(85)90016-6
|9 -- missing cx lookup --
|2 Crossref
999 C 5 |a 10.1103/PhysRevB.25.4452
|9 -- missing cx lookup --
|2 Crossref
999 C 5 |a 10.1103/PhysRevB.40.11561
|9 -- missing cx lookup --
|2 Crossref

LibraryCollectionCLSMajorCLSMinorLanguageAuthor
Marc 21