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@ARTICLE{Persheyev:47552,
      author       = {Persheyev, S. K. and Smirnov, V. and O'Neill, K. A. and
                      Reynolds, S. and Rose, M. J.},
      title        = {{A}tmospheric adsorption effects in hot-wire
                      chemical-vapor-deposition microcrystalline silicon films
                      with different electrode configurations},
      journal      = {Semiconductors},
      volume       = {39},
      issn         = {1063-7826},
      address      = {Berlin},
      publisher    = {Springer Science + Business Media},
      reportid     = {PreJuSER-47552},
      pages        = {343 - 346},
      year         = {2005},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {Hot-wire chemical-vapor-disposition (CVD) thin silicon
                      films are studied by means of dark conductivity, FTIR,
                      hydrogen evolution, and SEM surface characterization. Three
                      types of metastability are observed: (1) long term
                      irreversible degradation due to oxidization processes on the
                      film surface, (2) reversible degradation determined by
                      uncontrolled water and/or oxygen adsorption, and (3) a fast
                      field-switching effect in the film bulk. We propose that
                      this effect is associated with the morphology changes during
                      film growth and an electrical field induced by adsorbed
                      atmospheric components on the film surface. It is found that
                      metastable processes close to the film surface are stronger
                      than in the bulk. (c) 2005 Pleiades Publishing, Inc.},
      keywords     = {J (WoSType)},
      cin          = {IPV},
      ddc          = {530},
      cid          = {I:(DE-Juel1)VDB46},
      pnm          = {Photovoltaik},
      pid          = {G:(DE-Juel1)FUEK247},
      shelfmark    = {Physics, Condensed Matter},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000228012800015},
      doi          = {10.1134/1.1882798},
      url          = {https://juser.fz-juelich.de/record/47552},
}