TY  - JOUR
AU  - Meyer, R.
AU  - Waser, R.
AU  - Prume, K.
AU  - Schmitz, T.
AU  - Tiedke, S.
TI  - Dynamic leakage current compensation in ferroelectric thin-film capacitor structures
JO  - Applied physics letters
VL  - 86
SN  - 0003-6951
CY  - Melville, NY
PB  - American Institute of Physics
M1  - PreJuSER-49731
SP  - 142907
PY  - 2005
N1  - Record converted from VDB: 12.11.2012
AB  - We report on a measurement procedure to separate ferroelectric switching current and dielectric displacement current from the leakage current in leaky ferroelectric thin-film capacitor structures. The ac current response is determined for two adjacent frequencies. Taking advantage of the different frequency dependencies of the ferroelectric switching current, dielectric displacement current and ohmic current, the hysteresis loop is calculated without performing a static leakage current measurement, which causes a high dc field stress to the sample. The applicability of the proposed measurement procedure is demonstrated on a Pt/Pb(Zr,Ti)O-3/IrO2 ferroelectric capacitor revealing a high leakage current. (C) 2005 American Institute of Physics.
KW  - J (WoSType)
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000228242700044
DO  - DOI:10.1063/1.1897425
UR  - https://juser.fz-juelich.de/record/49731
ER  -