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000049733 084__ $$2WoS$$aPhysics, Applied
000049733 1001_ $$0P:(DE-HGF)0$$aNagarajan, V.$$b0
000049733 245__ $$aNanoscale polarization relaxation in a polycrystalline ferroelectric thin film: role of local environments
000049733 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2005
000049733 300__ $$a262910
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000049733 440_0 $$0562$$aApplied Physics Letters$$v86$$x0003-6951
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000049733 520__ $$aIn this letter, we report on the study of nanoscale polarization relaxation phenomena in polycrystalline PbZr0.4Ti0.6O3 films. Piezoresponse force microscopy (PFM) images of the as-grown sample reveal grains with a range of contrast, from fully white to gray to fully black. It is shown that this local change in the contrast (magnitude) of the piezoresponse from grain to grain can be attributed to the crystallographic orientation within each grain. PFM-based relaxation experiments show that the rate of relaxation is different for each grain, furthermore it is strongly dependent on the tilt of individual crystallographic orientation with respect to the polar axis. Strongly tilted away nonpolar axis grains show a much stronger decay of the polarization compared to polar axis-oriented grains. Therefore, for an ensemble of grains under a common top electrode, the relaxation events would first take place in grains, which are nonpolar axis oriented. (c) 2005 American Institute of Physics.
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000049733 7001_ $$0P:(DE-HGF)0$$aAggarwal, S.$$b1
000049733 7001_ $$0P:(DE-HGF)0$$aGruverman, A.$$b2
000049733 7001_ $$0P:(DE-HGF)0$$aRamesh, R.$$b3
000049733 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b4$$uFZJ
000049733 773__ $$0PERI:(DE-600)1469436-0$$a10.1063/1.1977183$$gVol. 86, p. 262910$$p262910$$q86<262910$$tApplied physics letters$$v86$$x0003-6951$$y2005
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