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@ARTICLE{Nagarajan:49733,
      author       = {Nagarajan, V. and Aggarwal, S. and Gruverman, A. and
                      Ramesh, R. and Waser, R.},
      title        = {{N}anoscale polarization relaxation in a polycrystalline
                      ferroelectric thin film: role of local environments},
      journal      = {Applied physics letters},
      volume       = {86},
      issn         = {0003-6951},
      address      = {Melville, NY},
      publisher    = {American Institute of Physics},
      reportid     = {PreJuSER-49733},
      pages        = {262910},
      year         = {2005},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {In this letter, we report on the study of nanoscale
                      polarization relaxation phenomena in polycrystalline
                      PbZr0.4Ti0.6O3 films. Piezoresponse force microscopy (PFM)
                      images of the as-grown sample reveal grains with a range of
                      contrast, from fully white to gray to fully black. It is
                      shown that this local change in the contrast (magnitude) of
                      the piezoresponse from grain to grain can be attributed to
                      the crystallographic orientation within each grain.
                      PFM-based relaxation experiments show that the rate of
                      relaxation is different for each grain, furthermore it is
                      strongly dependent on the tilt of individual
                      crystallographic orientation with respect to the polar axis.
                      Strongly tilted away nonpolar axis grains show a much
                      stronger decay of the polarization compared to polar
                      axis-oriented grains. Therefore, for an ensemble of grains
                      under a common top electrode, the relaxation events would
                      first take place in grains, which are nonpolar axis
                      oriented. (c) 2005 American Institute of Physics.},
      keywords     = {J (WoSType)},
      cin          = {IFF-IEM / CNI},
      ddc          = {530},
      cid          = {I:(DE-Juel1)VDB321 / I:(DE-Juel1)VDB381},
      pnm          = {Materialien, Prozesse und Bauelemente für die Mikro- und
                      Nanoelektronik},
      pid          = {G:(DE-Juel1)FUEK252},
      shelfmark    = {Physics, Applied},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000230090000049},
      doi          = {10.1063/1.1977183},
      url          = {https://juser.fz-juelich.de/record/49733},
}