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@ARTICLE{Tappe:49740,
author = {Tappe, S. and Bottger, U. and Waser, R.},
title = {{E}lectrostrictive resonances in ({B}a0.7{S}r0.3){T}i{O}3
thin films at microwave frequencies},
journal = {Applied physics letters},
volume = {85},
issn = {0003-6951},
address = {Melville, NY},
publisher = {American Institute of Physics},
reportid = {PreJuSER-49740},
pages = {624},
year = {2004},
note = {Record converted from VDB: 12.11.2012},
abstract = {The bias-voltage-dependent permittivity of (Ba0.7Sr0.3)TiO3
(BST) thin films with thicknesses ranging from 100 to 250 nm
is investigated in the frequency range from 500 MHz to 40
GHz by impedance spectroscopy of integrated BST capacitors.
The dielectric spectra of the films exhibit resonance
phenomena in the 4-7 GHz range when a bias field is applied.
It is shown that the main controlling parameter of the
resonance frequency is the film thickness. Calculations
based on the strong electrostrictive activity of the BST
films underline the assumption that the emission of plane
acoustic waves is the underlying mechanism for this
behavior. (C) 2004 American Institute of Physics.},
keywords = {J (WoSType)},
cin = {IFF-IEM / CNI},
ddc = {530},
cid = {I:(DE-Juel1)VDB321 / I:(DE-Juel1)VDB381},
pnm = {Materialien, Prozesse und Bauelemente für die Mikro- und
Nanoelektronik},
pid = {G:(DE-Juel1)FUEK252},
shelfmark = {Physics, Applied},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000222855400038},
doi = {10.1063/1.1775880},
url = {https://juser.fz-juelich.de/record/49740},
}