001     50079
005     20200423204306.0
017 _ _ |a This version is available at the following Publisher URL: http://apl.aip.org
024 7 _ |a 10.1063/1.2165279
|2 DOI
024 7 _ |a WOS:000234757100032
|2 WOS
024 7 _ |a 2128/1431
|2 Handle
037 _ _ |a PreJuSER-50079
041 _ _ |a eng
082 _ _ |a 530
084 _ _ |2 WoS
|a Physics, Applied
100 1 _ |a Guzenko, V. A.
|b 0
|u FZJ
|0 P:(DE-Juel1)VDB5614
245 _ _ |a Rashba effect in InGaAs/InP parallel quantum wires
260 _ _ |a Melville, NY
|b American Institute of Physics
|c 2006
300 _ _ |a 032102
336 7 _ |a Journal Article
|0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|0 0
|2 EndNote
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a article
|2 DRIVER
440 _ 0 |a Applied Physics Letters
|x 0003-6951
|0 562
|v 88
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a We report on the Rashba effect in InGaAs/InP quantum wires with an effective width ranging from 1.18 mu m down to 210 nm. By measuring 160 wires in parallel universal conductance, fluctuations could be suppressed so that the characteristic beating effect in the magnetorestistance was observable down to very low magnetic fields. A characteristic shift of the nodes in the beating pattern was found for decreasing wire width. By assuming a realistic soft-wall potential, the experimentally observed node positions could be reproduced. For the range of measured wires, our study confirms that the Rashba coupling parameter does not change with wire width.
536 _ _ |a Grundlagen für zukünftige Informationstechnologien
|c P42
|2 G:(DE-HGF)
|0 G:(DE-Juel1)FUEK412
|x 0
588 _ _ |a Dataset connected to Web of Science
650 _ 7 |a J
|2 WoSType
700 1 _ |a Knobbe, J.
|b 1
|u FZJ
|0 P:(DE-Juel1)VDB13653
700 1 _ |a Hardtdegen, H.
|b 2
|u FZJ
|0 P:(DE-Juel1)125593
700 1 _ |a Schäpers, T.
|b 3
|u FZJ
|0 P:(DE-Juel1)128634
700 1 _ |a Bringer, A.
|b 4
|u FZJ
|0 P:(DE-Juel1)VDB3169
773 _ _ |a 10.1063/1.2165279
|g Vol. 88, p. 032102
|p 032102
|q 88<032102
|0 PERI:(DE-600)1469436-0
|t Applied physics letters
|v 88
|y 2006
|x 0003-6951
856 7 _ |u http://dx.doi.org/10.1063/1.2165279
|u http://hdl.handle.net/2128/1431
856 4 _ |u https://juser.fz-juelich.de/record/50079/files/78280.pdf
|y OpenAccess
856 4 _ |u https://juser.fz-juelich.de/record/50079/files/78280.jpg?subformat=icon-1440
|x icon-1440
|y OpenAccess
856 4 _ |u https://juser.fz-juelich.de/record/50079/files/78280.jpg?subformat=icon-180
|x icon-180
|y OpenAccess
856 4 _ |u https://juser.fz-juelich.de/record/50079/files/78280.jpg?subformat=icon-640
|x icon-640
|y OpenAccess
909 C O |o oai:juser.fz-juelich.de:50079
|p openaire
|p open_access
|p driver
|p VDB
|p dnbdelivery
913 1 _ |k P42
|v Grundlagen für zukünftige Informationstechnologien
|l Grundlagen für zukünftige Informationstechnologien (FIT)
|b Schlüsseltechnologien
|0 G:(DE-Juel1)FUEK412
|x 0
914 1 _ |y 2006
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
915 _ _ |2 StatID
|0 StatID:(DE-HGF)0510
|a OpenAccess
920 1 _ |k CNI
|l Center of Nanoelectronic Systems for Information Technology
|d 14.09.2008
|g CNI
|z 381
|0 I:(DE-Juel1)VDB381
|x 1
920 1 _ |k IFF-TH-I
|l Theorie I
|d 31.12.2006
|g IFF
|0 I:(DE-Juel1)VDB30
|x 0
920 1 _ |k ISG-1
|l Institut für Halbleiterschichten und Bauelemente
|d 31.12.2006
|g ISG
|0 I:(DE-Juel1)VDB41
|x 2
970 _ _ |a VDB:(DE-Juel1)78280
980 _ _ |a VDB
980 _ _ |a JUWEL
980 _ _ |a ConvertedRecord
980 _ _ |a journal
980 _ _ |a I:(DE-Juel1)VDB381
980 _ _ |a I:(DE-Juel1)PGI-1-20110106
980 _ _ |a I:(DE-Juel1)PGI-9-20110106
980 _ _ |a UNRESTRICTED
980 _ _ |a FullTexts
980 1 _ |a FullTexts
981 _ _ |a I:(DE-Juel1)PGI-1-20110106
981 _ _ |a I:(DE-Juel1)PGI-9-20110106


LibraryCollectionCLSMajorCLSMinorLanguageAuthor
Marc 21