000050488 001__ 50488
000050488 005__ 20200423204316.0
000050488 017__ $$aThis version is available at the following Publisher URL: http://apl.aip.org
000050488 0247_ $$2DOI$$a10.1063/1.2162860
000050488 0247_ $$2WOS$$aWOS:000234968600067
000050488 0247_ $$2Handle$$a2128/1023
000050488 037__ $$aPreJuSER-50488
000050488 041__ $$aeng
000050488 082__ $$a530
000050488 084__ $$2WoS$$aPhysics, Applied
000050488 1001_ $$0P:(DE-HGF)0$$aOligschlaeger, R.$$b0
000050488 245__ $$aResistive switching and data reliability of epitaxial (Ba,SR)TiO3 thin films
000050488 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2006
000050488 300__ $$a042901
000050488 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article
000050488 3367_ $$2DataCite$$aOutput Types/Journal article
000050488 3367_ $$00$$2EndNote$$aJournal Article
000050488 3367_ $$2BibTeX$$aARTICLE
000050488 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000050488 3367_ $$2DRIVER$$aarticle
000050488 440_0 $$0562$$aApplied Physics Letters$$v88$$x0003-6951
000050488 500__ $$aRecord converted from VDB: 12.11.2012
000050488 520__ $$aWe report on resistive switching of capacitor-like SrRuO3/Ba0.7Sr0.3TiO3/Pt thin films epitaxially grown on SrTiO3 substrates. We observe a weak but stable hysteresis in the current-voltage curve. By applying short voltage pulses, a high or low resistive state as well as intermediate states can be addressed even at room temperature. We demonstrate a multiple-branch hysteresis curve corresponding to multilevel switching modus revealing different subloops for different write voltages. Furthermore reliability issues such as cycling endurance and data retention are presented. Read-write operations over 10 000 cycles show a fatigue-like drift of both resistance states. No data loss is found upon continuous readout.
000050488 536__ $$0G:(DE-Juel1)FUEK412$$2G:(DE-HGF)$$aGrundlagen für zukünftige Informationstechnologien$$cP42$$x0
000050488 588__ $$aDataset connected to Web of Science
000050488 650_7 $$2WoSType$$aJ
000050488 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b1$$uFZJ
000050488 7001_ $$0P:(DE-Juel1)VDB5958$$aMeyer, R.$$b2$$uFZJ
000050488 7001_ $$0P:(DE-Juel1)130751$$aKarthäuser, S.$$b3$$uFZJ
000050488 7001_ $$0P:(DE-Juel1)VDB5464$$aDittmann, R.$$b4$$uFZJ
000050488 773__ $$0PERI:(DE-600)1469436-0$$a10.1063/1.2162860$$gVol. 88, p. 042901$$p042901$$q88<042901$$tApplied physics letters$$v88$$x0003-6951$$y2006
000050488 8567_ $$uhttp://hdl.handle.net/2128/1023$$uhttp://dx.doi.org/10.1063/1.2162860
000050488 8564_ $$uhttps://juser.fz-juelich.de/record/50488/files/78827.pdf$$yOpenAccess
000050488 8564_ $$uhttps://juser.fz-juelich.de/record/50488/files/78827.jpg?subformat=icon-1440$$xicon-1440$$yOpenAccess
000050488 8564_ $$uhttps://juser.fz-juelich.de/record/50488/files/78827.jpg?subformat=icon-180$$xicon-180$$yOpenAccess
000050488 8564_ $$uhttps://juser.fz-juelich.de/record/50488/files/78827.jpg?subformat=icon-640$$xicon-640$$yOpenAccess
000050488 909CO $$ooai:juser.fz-juelich.de:50488$$pdnbdelivery$$pVDB$$pdriver$$popen_access$$popenaire
000050488 9131_ $$0G:(DE-Juel1)FUEK412$$bSchlüsseltechnologien$$kP42$$lGrundlagen für zukünftige Informationstechnologien (FIT)$$vGrundlagen für zukünftige Informationstechnologien$$x0
000050488 9141_ $$y2006
000050488 915__ $$0StatID:(DE-HGF)0010$$aJCR/ISI refereed
000050488 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000050488 9201_ $$0I:(DE-Juel1)VDB321$$d31.12.2006$$gIFF$$kIFF-IEM$$lElektronische Materialien$$x0
000050488 9201_ $$0I:(DE-Juel1)VDB381$$d14.09.2008$$gCNI$$kCNI$$lCenter of Nanoelectronic Systems for Information Technology$$x1$$z381
000050488 9201_ $$0I:(DE-82)080009_20140620$$gJARA$$kJARA-FIT$$lJülich-Aachen Research Alliance - Fundamentals of Future Information Technology$$x2
000050488 970__ $$aVDB:(DE-Juel1)78827
000050488 9801_ $$aFullTexts
000050488 980__ $$aVDB
000050488 980__ $$aJUWEL
000050488 980__ $$aConvertedRecord
000050488 980__ $$ajournal
000050488 980__ $$aI:(DE-Juel1)PGI-7-20110106
000050488 980__ $$aI:(DE-Juel1)VDB381
000050488 980__ $$aI:(DE-82)080009_20140620
000050488 980__ $$aUNRESTRICTED
000050488 980__ $$aFullTexts
000050488 981__ $$aI:(DE-Juel1)PGI-7-20110106
000050488 981__ $$aI:(DE-Juel1)VDB381
000050488 981__ $$aI:(DE-Juel1)VDB881